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dc.contributor.authorLin, CTen_US
dc.date.accessioned2014-12-08T15:41:29Z-
dc.date.available2014-12-08T15:41:29Z-
dc.date.issued2003-01-01en_US
dc.identifier.issn1083-4427en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TSMCA.2003.811115en_US
dc.identifier.urihttp://hdl.handle.net/11536/28214-
dc.description.abstractThis paper discusses the problem of single-channel speech enhancement in variable noise-level environment. Commonly used, single-channel subtractive-type speech enhancement algorithms always assume that the background noise level is fixed or slowly varying. In fact, the background noise level may vary quickly. This condition usually results in wrong speech/noise detection and wrong speech enhancement process. In order to solve this problem, we propose a new subtractive-type speech enhancement scheme in this paper. This new enhancement scheme uses the RTF (refined time-frequency parameter)-based RSONFIN (recurrent self-organizing neural fuzzy inference network) algorithm we developed previously to detect the word boundaries in the condition of variable background noise level. In addition, a new parameter (MiFre) is proposed to estimate the varying background noise level. Based on this parameter, the noise level information used for subtractive-type speech enhancement can be estimated not only during speech pauses, but also during speech segments. This new subtractive-type enhancement scheme has been tested and found to perform well, not only in variable background noise level condition, but also in fixed background noise level condition.en_US
dc.language.isoen_USen_US
dc.subjectfilter banken_US
dc.subjectnoise estimationen_US
dc.subjectrecurrent networken_US
dc.subjecttime-frequency analysisen_US
dc.subjectword boundary detectionen_US
dc.titleSingle-channel speech enhancement in variable noise-level environmenten_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TSMCA.2003.811115en_US
dc.identifier.journalIEEE TRANSACTIONS ON SYSTEMS MAN AND CYBERNETICS PART A-SYSTEMS AND HUMANSen_US
dc.citation.volume33en_US
dc.citation.issue1en_US
dc.citation.spage137en_US
dc.citation.epage144en_US
dc.contributor.department電控工程研究所zh_TW
dc.contributor.departmentInstitute of Electrical and Control Engineeringen_US
dc.identifier.wosnumberWOS:000183600800013-
dc.citation.woscount14-
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