A note on Bayesian estimation of process capability indices

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DC Field	Value	Language
dc.contributor.author	Shiau, JJH	en_US
dc.contributor.author	Hung, HN	en_US
dc.contributor.author	Chiang, CT	en_US
dc.date.accessioned	2014-12-08T15:46:03Z	-
dc.date.available	2014-12-08T15:46:03Z	-
dc.date.issued	1999-11-15	en_US
dc.identifier.issn	0167-7152	en_US
dc.identifier.uri	http://hdl.handle.net/11536/30966	-
dc.description.abstract	Process capability indices are useful for assessing the capability of manufacturing processes. Most traditional methods are obtained from the frequentist point of view. We view the problem fi om the Bayes and empirical Bayes approaches by using non-informative and conjugate priors, respectively. (C) 1999 Elsevier Science B.V. All rights reserved.	en_US
dc.language.iso	en_US	en_US
dc.subject	process capability indices	en_US
dc.subject	Bayesian approach	en_US
dc.subject	Bayes estimators	en_US
dc.subject	non-informative prior	en_US
dc.subject	conjugate prior	en_US
dc.title	A note on Bayesian estimation of process capability indices	en_US
dc.type	Article	en_US
dc.identifier.journal	STATISTICS & PROBABILITY LETTERS	en_US
dc.citation.volume	45	en_US
dc.citation.issue	3	en_US
dc.citation.spage	215	en_US
dc.citation.epage	224	en_US
dc.contributor.department	統計學研究所	zh_TW
dc.contributor.department	Institute of Statistics	en_US
dc.identifier.wosnumber	WOS:000082784700004	-
dc.citation.woscount	11	-
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