超快掃描探針式顯微術及其應用之研究

Full metadata record

DC Field	Value	Language
dc.contributor.author	潘犀靈	en_US
dc.contributor.author	CI-LINGPAN	en_US
dc.date.accessioned	2014-12-13T10:37:58Z	-
dc.date.available	2014-12-13T10:37:58Z	-
dc.date.issued	1998	en_US
dc.identifier.govdoc	NSC87-2215-E009-022	zh_TW
dc.identifier.uri	http://hdl.handle.net/11536/94978	-
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=411495&docId=72847	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.language.iso	zh_TW	en_US
dc.subject	超快掃描	zh_TW
dc.subject	探針式顯微鏡	zh_TW
dc.subject	Ultrafast scanning	en_US
dc.subject	Probe microscope	en_US
dc.title	超快掃描探針式顯微術及其應用之研究	zh_TW
dc.type	Plan	en_US
dc.contributor.department	交通大學光電工程研究所	zh_TW
Appears in Collections:	Research Plans