超大型積體電路測試與可測性設計課程發展---總計畫(II)

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dc.contributor.author李崇仁en_US
dc.contributor.department國立交通大學電子工程研究所zh_TW
dc.date.accessioned2014-12-13T10:38:44Z
dc.date.available2014-12-13T10:38:44Z
dc.date.issued1996en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC85-2512-S009-008-EEzh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=222949&docId=39948en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/95630
dc.language.isozh_TWen_US
dc.title超大型積體電路測試與可測性設計課程發展---總計畫(II)zh_TW
dc.title"VLSI Testing and Design for Testability" Course Development (II)en_US
dc.typePlanen_US

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