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Home
學術出版;;Publications
研究計畫;;Research Plans
下一世代高性能及高可靠性的N通道MOS元件設計及量測技術探討
下一世代高性能及高可靠性的N通道MOS元件設計及量測技術探討
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982221E009161MY3(第3年).PDF
(1.2 MB)
Date
2011
Authors
莊紹勳
Chung Steve S
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https://www.grb.gov.tw/search/planDetail?id=2205386&docId=351807
https://ir.lib.nycu.edu.tw/handle/11536/98976
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