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Home
學術出版;;Publications
研究計畫;;Research Plans
單晶片系統驗證之核心技術開發-子計畫六:針對先進晶片設計的熱點驗證之完整熱模型與高效能熱分析(I)
單晶片系統驗證之核心技術開發-子計畫六:針對先進晶片設計的熱點驗證之完整熱模型與高效能熱分析(I)
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942220E009044.PDF
(319.39 KB)
Date
2005
Authors
李育民
LEE YU-MIN
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https://www.grb.gov.tw/search/planDetail?id=1147365&docId=220369
https://ir.lib.nycu.edu.tw/handle/11536/90034
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