超大型積體電路之測試與可測性設計

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892215E009042.pdf (50.47 KB)

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2000

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靜態電流測試, 振盪環測試, 數位測試, 類比測試, 非同步序向電路, 運算放大器, 內建式電流感測器, 障礙模型, IDDQ testing, Oscillating ring testing, Digital testing, Analog testing, Asynchronous sequential circuit, Operational amplifier, Built-in current sensor, Fault model

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https://www.grb.gov.tw/search/planDetail?id=542238&docId=99619
 https://ir.lib.nycu.edu.tw/handle/11536/102691

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研究計畫;;Research Plans

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