RF CMOS 雜訊分析與可靠性研究

dc.contributor.author汪大暉en_US
dc.contributor.authorWANG TAHUIen_US
dc.contributor.department國立交通大學電子工程學系zh_TW
dc.date.accessioned2014-12-13T10:36:19Z
dc.date.available2014-12-13T10:36:19Z
dc.date.issued2000en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC89-2215-E009-094zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=583853&docId=109697en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/93869
dc.language.isozh_TWen_US
dc.titleRF CMOS 雜訊分析與可靠性研究zh_TW
dc.titleRF CMOS Noise Analysis and Reliabilityen_US
dc.typePlanen_US

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