利用掃描式穿隧電子顯微鏡量取超導能隙與溫度之關係(I)

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dc.contributor.author溫增明en_US
dc.contributor.authorUEN TZENG-MINGen_US
dc.contributor.department國立交通大學電子物理學系zh_TW
dc.date.accessioned2014-12-13T10:48:43Z
dc.date.available2014-12-13T10:48:43Z
dc.date.issued2000en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC89-2112-M009-051zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=545355&docId=100377en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/101426
dc.language.isozh_TWen_US
dc.title利用掃描式穿隧電子顯微鏡量取超導能隙與溫度之關係(I)zh_TW
dc.titleStudy of the Temperature-Dependent Energy Gap of High-Tc Superconductors by Scanning Tunneling Microscope(I)en_US
dc.typePlanen_US

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