Browsing by Author "Chen, W. K."

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Carrier dynamics in isoelectronic ZnSe(1-x)O(x) semiconductors
(2010-07-26)
Lin, Y. C.
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Chung, H. L.
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Chou, W. C.
;
Chen, W. K.
;
Chang, W. H.
This study explores the effects of both Oxygen and temperature on the carrier dynamics of isoelectronic ZnSe(1-x)O(x) (x=0.027 and 0.053) semiconductors using photoluminescence (PL) and time-resolved PL spectroscopy. We find that the Kohlrausch law is highly consistent with the complex decay traces induced by isoelectronic O traps, and the mechanism of carrier recombination undergoes a complicated change from trapped to free excitons with the increase in temperature. Complex recombination processes are clarified using the relaxation model based on various decay channels. These findings are consistent with the initial fall in the stretching exponent beta followed by its monotonic increase with increasing temperature. (C) 2010 American Institute of Physics. [doi:10.1063/1.3473776]
Carrier dynamics in isoelectronic ZnSe1-xOx semiconductors
(2010-07-26)
Lin, Y. C.
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Chung, H. L.
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Chou, W. C.
;
Chen, W. K.
;
Chang, W. H.
This study explores the effects of both Oxygen and temperature on the carrier dynamics of isoelectronic ZnSe1-xOx (x=0.027 and 0.053) semiconductors using photoluminescence (PL) and time-resolved PL spectroscopy. We find that the Kohlrausch law is highly consistent with the complex decay traces induced by isoelectronic O traps, and the mechanism of carrier recombination undergoes a complicated change from trapped to free excitons with the increase in temperature. Complex recombination processes are clarified using the relaxation model based on various decay channels. These findings are consistent with the initial fall in the stretching exponent beta followed by its monotonic increase with increasing temperature. (C) 2010 American Institute of Physics. [doi:10.1063/1.3473776]
Effect of donor-acceptor concentration ratios on nonradiative energy transfer in closely packed CdTe quantum dots
(2009-09-28)
Lin, Y. C.
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Wang, W. J.
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Chung, H. L.
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Chou, W. C.
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Chen, W. K.
This study investigates the dependence of Forster resonance energy transfer (FRET) on donor-acceptor (D/A) concentration ratios in mixed-size CdTe quantum dots (QDs) films by using photoluminescence (PL) and time-resolved PL spectroscopy. Experimental results indicate that an increasing donor concentration significantly quenches the emission intensity and lifetime in donor QDs and enhances that in acceptor QDs, providing clear evidence of increased FRET efficiency. When D/A ratio exceeds 6, however, the emission intensity and the lifetime of acceptors start to decline, reflecting a decreasing FRET efficiency because of a markedly declining availability of acceptor QDs. (C) 2009 American Institute of Physics. [doi:10.1063/1.3242371]
Effect of ZnSe partial capping on the ripening dynamics of CdSe quantum dots
(2007-02-19)
Lai, Y. J.
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Yang, C. S.
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Chen, W. K.
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Lee, M. C.
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Chang, W. H.
The ripening dynamics of CdSe quantum dots (QDs) partially capped with ZnSe layer are investigated. Atomic force microscopy (AFM) images show that the ripening of QDs is dramatically accelerated by depositing a ZnSe partial capping layer. The driving force of ripening enhancement is attributed to the increasing strain energy with capping thickness. For a ZnSe partial capping layer of below 3 ML, photoluminescence exhibits a clear redshift with increasing ZnSe monolayers. It is attributed to the size of the CdSe QD increases with ZnSe partial capping, in a manner that is consistent with the results of the AFM study. (c) 2007 American Institute of Physics.
Growth and optical properties of high-density InN nanodots
(2010-10-15)
Ke, W. C.
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Lee, S. J.
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Kao, C. Y.
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Chen, W. K.
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Chou, W. C.
High density InN/GaN nanodots were grown by pulsed mode (PM) metal-organic chemical vapor deposition (MOCVD). InN nanodots density of up to similar to 5 x 10(10) cm(-2) at a growth temperature of 550 degrees C was achieved. The high diffusion activation energy of 2.65 eV due to high NH(3) flow rate generated more reactive nitrogen adatoms on the growth surface, and is believed to be the main reason for the growth of high density InN nanodots. In addition, an anomalous temperature dependence of the PL peak energy was observed for high density InN nanodots. The high carrier concentration, due to high In vacancy (V(ln)) in the InN nanodots, thermally agitated to the conduction band. As the measurement temperature increased, the increase of Fermi energy resulted in blue-shifted PL peak energy. From the Arrhenius plot of integrated PL intensity, the thermal activation energy for the PM grown InN nanodots was estimated to be E(a)similar to 51 meV, indicating strong localization of carriers in the high density InN nanodots. (C) 2010 Elsevier B.V. All rights reserved.
Growth of optical-quality, uniform In-rich InGaN films using two-heater metal-organic chemical vapor deposition
(2013-11-15)
Fu, S. F.
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Chen, C. Y.
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Li, F. W.
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Hsu, C. H.
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Chou, W. C.
Good-optical-quality, thick InxGa1-xN films with high In content were grown using a homemade two-heater metal-organic chemical vapor deposition system. By varying the growth temperature, it was Found that the In composition of the InGaN epilayer varied from 18 to 59% as the substrate temperature decreased from 750 to 625 degrees C. Our results show that the optical properties in terms of the emission peak wavelength and linewidth are uniformly distributed throughout the entire 2 in. wafer for the x=0.40 InGaN sample. The resultant mean peak wavelength and FWHM are 808 +/- 6 nm and 229 +/- 18 meV, respectively, at 18 K. In addition, for the InGaN film grown at 625 degrees C, a noticeable decrease in the In composition occurred when the ceiling temperature was >800 degrees C, indicative of the occurrence of parasitic reactions in the gas phase. (C) 2013 Elsevier B.V. All rights reserved.
Impacts of ammonia background flows on structural and photoluminescence properties of InN dots grown on GaN by flow-rate modulation epitaxy
(2006-12-25)
Ke, W. C.
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Lee, L.
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Chen, C. Y.
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Tsai, W. C.
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Chang, W. -H.
Structural and photoluminescence (PL) properties of InN dots grown on GaN by metal organic vapor phase epitaxy using the flow-rate modulation technique, and their dependence on growth conditions, were investigated. An ammonia (NH3) background flow was intentionally supplied during indium deposition periods to control the kinetics of adatoms and hence the morphology of InN dots. Samples prepared under lower NH3 background flows generally exhibit narrower and more intense PL signals peaked at lower emission energies. The authors point out that the NH3 background flow is an important parameter that controls not only the nucleation process but also the emission property of InN dots. (c) 2006 American Institute of Physics.
Incorporation Behaviors of In and Ga in the Two-Heater MOVPE Growth of InGaN Films
(2016)
Fu, S. F.
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Cheng, C. H.
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Lee, F. W.
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Chen, S. Y.
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Liao, B. W.
Incorporation behaviors of In and Ga of InGaN films grown by the two-heater metal-organic vapor-phase epitaxial horizontal reactor is investigated by varying growth parameters, such as the substrate temperature, ceiling temperature and reactor pressure. Two In loss mechanisms are observed by the analysis of the concentration and temperature profiles in the deposition zone. The gas-phase parasitic-loss mechanism (activation energy similar to 34.2 +/- 0.1 kcal/mol) is significant in the ceiling temperature T-ceil >= 800 degrees C and at substrate temperature (T-sub) of 600 degrees C. The decomposition-loss mechanism, which arises from In desorption on the growing surface, is significant in T-sub > 625 degrees C region. The desorption activation energy obtained is 28.0 +/- 0.1 kcal/mol, which is close to that of InN (25-26 kcal/mol). This suggests the In decomposition-loss mechanism in InGaN growth does not differ substantially from that in binary InN growth. On the other hand, the gas-phase parasitic-loss mechanism of Ga is negligible in the growth condition that we have explored. Exception is found for reactor pressure at T-ceil = 950 degrees C, where both factors advantageous and disadvantageous to Ga incorporation are unambiguously observed. We have proposed explanation for the above observation. (C) The Author(s) 2016. Published by ECS. All rights reserved.
Magneto-optical properties of ZnMnTe/ZnSe quantum dots
(2011-05-15)
Fan, W. C.
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Ku, J. T.
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Chou, W. C.
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Chen, W. K.
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Chang, W. H.
The sigma(+) and sigma(-) circularly polarized time-integrated and time-resolved Photoluminescence (PL) measurements were employed to investigate the carrier spin dynamics of ZnMnTe/ZnSe Quantum Dots (QDs) grown on GaAs substrates by molecular beam epitaxy. The Kohlrausch's stretching exponential function well correlates both the sigma(+) and sigma(-) decay profiles. The measured spin relaxation time is about 23 ns. (C) 2010 Elsevier B.V. All rights reserved.
Optical characterization of isoelectronic ZnSe(1-x)O(x) semiconductors
(2011-05-15)
Lin, Y. C.
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Chung, H. L.
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Ku, J. T.
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Chen, C. Y.
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Chien, K. F.
We have studied the temperature dependence of the band gap and the decay dynamics of isoelectronic ZnSe(1-x)O(x) (x=0-0.053) semiconductors, using photoluminescence (PL) and time-resolved PL spectroscopy. The temperature dependence of the band gap of ZnSe(1-x)O(x) decreases with the increase in 0 concentration. The Kohlrausch law is in good agreement with the O-induced complex decay profiles. As temperature increases, the mechanism of carrier decay undergoes a complicated change from trapped to free excitons. These findings are consistent with the temperature dependence of the stretching exponent beta. (C) 2010 Elsevier B.V. All rights reserved.
Optical characterization of isoelectronic ZnSe1-xOx semiconductors
(2011-05-15)
Lin, Y. C.
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Chung, H. L.
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Ku, J. T.
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Chen, C. Y.
;
Chien, K. F.
We have studied the temperature dependence of the band gap and the decay dynamics of isoelectronic ZnSe1-xOx (x=0-0.053) semiconductors, using photoluminescence (PL) and time-resolved PL spectroscopy. The temperature dependence of the band gap of ZnSe1-xOx decreases with the increase in 0 concentration. The Kohlrausch law is in good agreement with the O-induced complex decay profiles. As temperature increases, the mechanism of carrier decay undergoes a complicated change from trapped to free excitons. These findings are consistent with the temperature dependence of the stretching exponent beta. (C) 2010 Elsevier B.V. All rights reserved.
Pressure-induced metallization and resonant Raman scattering in Zn(1-x)Mn(x)Te
(2008-07-01)
Lin, Y. C.
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Fan, W. C.
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Chiu, C. H.
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Ke, F. K.
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Yang, S. L.
Pressure-induced resonant Raman scattering is adopted to analyze the zone-center optical phonon modes and crystal characteristics of Zn(1-x)Mn(x)Te (0 <= x <= 0.26) thin films. The pressure (Pt) at which the semiconducting undergoes a transition to the metallic phase declines as a function of Mn concentration (x) according to the formula Pt(x)=15.7-25.4x+19.0x(2) (GPa). Pressure-dependent longitudinal and transverse optical phonon frequencies and the calculated mode Gruneisen parameters were adopted to investigate the influence of Mn(2+) ions on the iconicity. The experimental results indicate that the manganese ions tend to increase the iconicity of ZnTe under ambient conditions, whereas an external hydrostatic pressure tends to reduce the iconicity and the bond length of Zn(1-x)Mn(x)Te. (c) 2008 American Institute of Physics.
Raman scattering of longitudinal-optical-phonon-plasmon coupling in Cl-doped ZnSe under high pressure
(2007-12-15)
Lin, Y. C.
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Chiu, C. H.
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Fan, W. C.
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Chia, C. H.
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Yang, S. L.
The vibrational, electronic, and crystalline properties of n-type chlorine-doped ZnSe (ZnSe:Cl) layers with a carrier concentration from 8.2x10(15) to 1.8x10(18) cm(-3) are studied by Raman spectroscopy. The spectral line shapes of the longitudinal-optical-phonon and plasmon coupling mode are analyzed using the Raman scattering efficiency and the dielectric function to obtain the electron densities and mobility. The splitting of the transverse-optical (TO) phonon and the redshift of the chlorine-related impurity vibration mode are clearly observed when pressure is applied. The semiconductor-to-metal phase transition pressure of ZnSe:Cl layers declines as the carrier concentration increases, indicating that n-type doping reduces crystal stability. Additionally, the pressure-induced weakening of the longitudinal-optical-phonon-plasmon coupling efficiency suggests that pressure tends to degrade the n-type characteristic of ZnSe:Cl because of the emergence of the new deep donorlike state. (c) 2007 American Institute of Physics.
The structural and optical properties of InN nanodots grown with various V/III ratios by metal-organic chemical vapor deposition
(2009-07-22)
Fu, S. F.
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Wang, S. M.
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Lee, L.
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Chen, C. Y.
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Tsai, W. C.
Self-assembled InN nanodots have been prepared at 650 degrees C with various V/III ratios from 500 to 30 000 by metal-organic chemical vapor deposition (MOCVD). It is found that the dot density and morphological size as well as the optical properties all display drastic changes at V/III = 12000. Generally, denser and smaller InN nanodots with higher emission energy and narrower linewidth were obtained when growth was conducted at V/III ratios slightly lower than 12 000 as compared to those at higher V/III ratios. The physical properties of our MOCVD-grown InN nanodots are sensitive to the surface structure and the morphology is very similar to molecular beam epitaxially grown GaN and InN films, which may be used as a guide to optimize the InN growth.
Time-resolved photoluminescence of isoelectronic traps in ZnSe(1-x)Te(x) semiconductor alloys
(2008-12-15)
Lin, Y. C.
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Chou, W. C.
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Fan, W. C.
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Ku, J. T.
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Ke, F. K.
Kohlrausch's stretched exponential law correlates well with the photoluminescence (PL) decay profiles of ZnSe(1-x)Te(x). As the Te concentration increases, the stretching exponent beta initially declines and then monotonically increases. This result can be understood using the hopping-transport and energy transfer model. The increase in the number of isoelectronic Te localized traps can reduce the PL decay rate and increase the linewidth, whereas the hybridization of the Te localized states with the valence-band edge states causes a reduction in both the lifetime and linewidth.
Time-resolved photoluminescence of isoelectronic traps in ZnSe1-xTex semiconductor alloys
(2008-12-15)
Lin, Y. C.
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Chou, W. C.
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Fan, W. C.
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Ku, J. T.
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Ke, F. K.
Kohlrausch's stretched exponential law correlates well with the photoluminescence (PL) decay profiles of ZnSe1-xTex. As the Te concentration increases, the stretching exponent beta initially declines and then monotonically increases. This result can be understood using the hopping-transport and energy transfer model. The increase in the number of isoelectronic Te localized traps can reduce the PL decay rate and increase the linewidth, whereas the hybridization of the Te localized states with the valence-band edge states causes a reduction in both the lifetime and linewidth.