Browsing by Author "Chiu, DY"

Now showing 1 - 1 of 1

Analysis of low-frequency noise in boron-doped polycrystalline silicon-germanium resistors
(2002-09-30)
Chen, KM
;
Huang, GW
;
Chiu, DY
;
Huang, HJ
;
Chang, CY
Low-frequency noise in boron-doped polycrystalline silicon-germanium (poly-Si1-xGex) resistors at various temperatures is studied. The poly-Si1-xGex films with 0%similar to36% Ge content were grown using ultrahigh vacuum chemical molecular epitaxy system. We find that the low-frequency noise in poly-Si1-xGex decreases with increasing Ge content, due to the lower potential barrier height of grain boundaries in higher Ge content samples. Moreover, the low-frequency noise decreases with increasing temperature. These results are well explained by the carrier mobility fluctuation model. (C) 2002 American Institute of Physics.