Browsing by Author "Deng, YM"

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An automatic macro program for radio frequency MOSFET characteristics analysis
(2001-10-01)
Su, CY
;
Chang, SJ
;
Chen, LP
;
Ho, YP
;
Huang, GW
The parameter extraction language (PEL) in Agilent IC-CAP software is used to develop an automatic macro program for the analysis of the characteristics of RF MOSFETs. By using this powerful macro program, the time spent on the measurement of the MOSFET characteristics and the related analysis is effectively reduced. This macro program permits a fast and accurate method to obtain the DC and RF characteristics of MOSFETs with different device geometries and operating conditions. It is also suitable for high volume measurements and analyses of MOSFET, and provides a solid jou 71 dation for RF circuit design.
Effect of coplanar probe pad design on noise figures of 0.35 mu m MOSFETs
(2000-07-20)
Su, CY
;
Chen, LP
;
Chang, SJ
;
Huang, GW
;
Ho, YP
The effects of different coplanar ground-signal-ground (GSG) probe pads on the noise figure characteristics of submicron MOSFETs are presented. Devices with top-level metal as probe pads shielded by grounded bottom-level metal possess the most appropriate probe pad structure for characterising the noise performance of MOSFETs. Equivalent circuits of the probe pads are used to explain the different noise behaviours.