Browsing by Author "Hsu, CC"
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Item type:Item, A 125 MHz 86 dB IM3 programmable-gain amplifier(2002) ;Hsu, CC ;Wu, JT ;電子工程學系及電子研究所Department of Electronics Engineering and Institute of ElectronicsA digitally programmable-gain amplifier (PGA) is realized using a 0.35 mum CMOS technology. Constant bandwidth and high linearity are achieved by using a current-mode amplifier with resistor-network feedback. The PGA has a voltage gain varying from 0 dB to 19 dB with a bandwidth of 125 MHz. With 1 Vpp output, the third-order intermodulation (IM3) of the PGA is -86 dB at 10 MHz and -59 dB at 80 MHz. The distortion is also insensitive to the gain change. The circuit dissipates 21 mW from a 3.3 V supply.Item type:Item, A 33-mW 12-bit 100-MHz sample-and-hold amplifier(2002) ;Hsu, CC ;Wu, JT ;電子工程學系及電子研究所Department of Electronics Engineering and Institute of ElectronicsA high-speed high-resolution sample-and-hold amplifier (SHA) is designed for time-interleaved analog-to-digital converter applications. Using the techniques of pre-charging and output capacitor coupling can mitigate the requirements for the opamp, resulting in low power dissipation. Implemented in a standard 0.25 mum CMOS technology, the SHA achieves 73 dB SFDR for 2 Vpp input at 100 MHz sampling rate. The performance is not degraded for input's frequency up to the Nyquist frequency. Power consumption is 33 mW from a single 2.5 V supply.Item type:Item, A CMOS 33-mW 100-MHz 80-dB SFDR sample-and-hold amplifier(2003-01-01) ;Hsu, CC ;Wu, HT ;電子工程學系及電子研究所Department of Electronics Engineering and Institute of ElectronicsA high-speed high-resolution sample-and-hold amplifier (SHA) is designed for time-interleaved analog-to-digital converter applications. Using the techniques of precharging and output capacitor coupling can mitigate the stringent performance requirements for the opamp, resulting in low power dissipation. Implemented in a standard 0.25 mum CMOS technology, the SHA achieves 80 dB spurious-free dynamic range (SFDR) for a 1.8 Vpp output at 100 MHz Nyquist sampling rate. The SHA occupies a die area of 0.35 mm(2) and dissipates 33 mW from a single 2.5 V supply.Item type:Item, A CMOS 33-mW 100-MHz 80-dB SFDR sample-and-hold amplifier(2003-10-01) ;Hsu, CC ;Wu, JT ;電子工程學系及電子研究所Department of Electronics Engineering and Institute of ElectronicsA high-speed high-resolution sample-and-hold amplifier (SHA) is designed for time-interleaved analog-to-digital converter applications. Using the techniques of precharging and output capacitor coupling can mitigate the stringent performance requirements for the opamp, resulting in low power dissipation. Implemented in a standard 0.25 mum CMOS technology, the SHA achieves 80 dB spurious-free dynamic range (SFDR) for a 1.8 Vpp output at 100MHz Nyquist sampling rate. The SHA occupies a die area of 0.35 mm(2) and dissipates 33mW from a single 2.5V supply.Item type:Item, A highly linear 125-MHz CMOS switched-resistor programmable-gain amplifier(2003-10-01) ;Hsu, CC ;Wu, JT ;電子工程學系及電子研究所Department of Electronics Engineering and Institute of ElectronicsA highly linear programmable-gain amplifier (PGA) is fabricated using a 0.35-mum CMOS technology. High linearity and constant wide bandwidth are achieved by using a high-gain amplifier with low input impedance and resistor-network feedback. The voltage gain is varied by digitally controlling the input switched resistors. The distortion of a switched resistor has been analyzed using the Volterra series. The PGA has a voltage gain varying from 0 to 19 dB, while maintaining a constant bandwidth of 125 MHz. The third-order intermodulation distortion is -86 dB at 10 MHz. The circuit dissipates 21 mW from a 3.3-V supply.Item type:Item, A method for measuring the complex refractive index and thickness of a thin metal film(2003-12-01) ;Chen, KH ;Hsu, CC ;Su, DC ;光電工程學系Department of PhotonicsA circularly polarized heterodyne light beam is incident on a thin metal film, causing successive reflections and refractions to occur at the two sides of the thin film. The phase difference between p- and s-polarizations of the multiple-beam interference signal can be measured accurately with an analyzer and heterodyne interferometry. The phase difference depends on the azimuth angle of the analyzer, the complex refractive index and the thickness of the thin metal film. The measured values of the phase differences under three different azimuth angles of the analyzer can be substituted into the special equations derived from Fresnel's equations and multiple-beam interference. Hence, the complex refractive index and the thickness of the thin metal film can be estimated by using a personal computer with a numerical analysis technique. Because of its common-path optical configuration and its heterodyne interferometric phase measurement, this method has many merits, such as high stability against surrounding vibrations, high resolution and easy operation.Item type:Item, A method for measuring the concentration of a solution(2003) ;Su, DC ;Chen, KH ;Hsu, CC ;交大名義發表National Chiao Tung UniversityWhen a linearly polarized light beam enters a surface-plasmon-resonanse (SPR) apparatus and is incident on the boundary surface with tested solution at the resonant angle, the phase difference between s- and p- polarizations is changed with the concentration of the solution. And the phase difference can be measured accurately by the heterodyne interferometry. Based on these effects, a method for measuring the concentration of a solution is presented.Item type:Item, A method for measuring the rotatory power of a chiral medium(2001) ;Su, DC ;Hsu, CC ;Lin, JY ;Lee, JY光電工程學系A light beam coming from a circularly polarized heterodyne light source passes through a chiral medium, its rotation angle is just half of the phase difference between p- and s- polarization components. And this phase difference can be measured accurately with heterodyne interferometric technique. The rotatory power is obtained by dividing the estimated rotation angle with its path length. This method has many advantages, such as, high stability, high resolution, easy operation, and real-time measurement.Item type:Item, A neural network-based adaptive algorithm on the single EWMA controller(2004-04-01) ;Hsu, CC ;Su, CT ;工業工程與管理學系Department of Industrial Engineering and ManagementThe single EWMA controller has been proven to have excellent performance for small disturbances in the run-to-run process. However, incorrect selection of the EWMA parameter can have the opposite effect on the controlled process output. An adaptive system is necessary to automatically adjust the controller parameters on-line in order to have better performance. In this study, a simple and efficient algorithm based on neural networks (NN) is proposed to minimise the inflation of the output variance on line. The authors have shown that the sequence of EWMA gains, generated by a NN-based adaptive approach, converges close to the optimal controller value under IMA (1, 1), step and trend disturbance models. The paper also shows that the NN-based adaptive EWMA controller has a superior performance than its predecessors.Item type:Item, A time-varying weights tuning method of the double EWMA controller(2004-12-01) ;Su, CT ;Hsu, CC ;工業工程與管理學系Department of Industrial Engineering and ManagementIn recent years, the exponential-weighted-moving-average (EWMA) statistic based controllers are popular in semiconductor manufacturing. However, the single EWMA controller is not sufficient for compensating for the wear-out process. Thus, a double EWMA controller was proposed to enhance the capability for controlling the drifting process. In the literatures, in the solution of the double EWMA controller, only the "trade-off" solution weights are used to tune the controller. However, it is a fixed weight tuning method, and it is known that a time-varying weight will produce a superior performance over that of a fixed one (J. Quality Technol. 29 (1997) 184). Therefore, this study aims to develop a heuristic time-varying weights tuning method for the double EWMA controller. The numerical results showed that the proposed time-varying tuning method possesses an improvement of least 10% over that of the fixed weight scheme. (C) 2004 Elsevier Ltd. All rights reserved.Item type:Item, Accuracy of the EasyTouch blood glucose self-monitoring system: a study of 516 cases(2004-11-01) ;Dai, KS ;Tai, DY ;Ho, P ;Chen, CCPeng, WCBackground: Self-monitoring blood glucose device is an important toot for diabetes patients to efficiently control their blood glucose concentrations. We evaluated the accuracy of EasyTouch glucose monitoring system. Methods: Capillary blood glucose concentrations measured using EasyTouch and the reference values obtained from Yellow Springs Instruments (YSI) 2300 STAT were performed in the Department of Laboratory Medicine, Wei-Gong Memorial Hospital. Results were evaluated using (1) linear regression analysis, (2) Clarke Error Grid analysis, (3) percentage of readings within a defined range of deviation from the reference value, (4) bias plots, and (5) coefficients of variation (CVs) calculated from 60 measurements in series. Results: The window of the 516 EasyTouch readings covered a range from 42 to 555 mg/dl. Linear regression analysis yielded a regression slope 0.9972, intercept 1.899 mg/dl, r(2) 0.9571, and Syx 14.89 mg/dl. A Clarke Error Grid analysis showed 100% of the EasyTouch readings in clinically acceptable zones A and B. Of the EasyTouch readings, 98.3%, 91.9%, 78.3% and 46.9% were found within +/-20%, +/-15%, +/-10%, and +/-5%, respectively, of the reference values. Further analysis showed that the percentage of EasyTouch readings within the defined intervals was similar in three glucose ranges (less than or equal to100, 101-200, and greater than or equal to201 mg/dl). The CVs for the four lots of strips (lot 1 to lot 4) ranged from 3.5 to 5.5%, 2.1 to 4.8%, 1.8 to 3.6%, and 3.0 to 5.7%, respectively. Conclusions: EasyTouch provides high accurate and precise glucose readings over a wide range of glucose concentrations. (C) 2004 Elsevier B.V. All rights reserved.Item type:Item, Alternative method for measuring both the refractive indices and the thickness of silver-halide holographic plates(2005-05-01) ;Hsu, CC ;Lin, JY ;Chen, KH ;Su, DC光電工程學系First, the phase differences between s- and p-polarizations of a circularly polarized heterodyne light beam reflected from the emulsion layer, and that from its substrate, are measured, respectively. The measured data are substituted into specially derived equations, so the refractive indices of the emulsion layer and its substrate can be calculated. Second, the variations of phase differences between s- and p-polarizations due to the wavelength shifts and the extraction of the holographic plate in a modified Michelson interferometer are measured. Then, the thickness of the emulsion layer and its substrate can be estimated based on the measured values of refractive indices, the wavelength shifts, and the phase difference variations. This method has some advantages, such as high resolution and easy operation in only one optical configuration. (c) 2005 Society of Photo-Optical Instrumentation Engineers.Item type:Item, An evaluation of clinical accuracy of the EasyTouch blood uric acid self-monitoring system(2005-03-01) ;Dai, KS ;Tai, DY ;Ho, P ;Chen, CCPeng, WCObjectives: Self-monitoring blood uric acid device is an important tool for patients to efficiently monitor their blood uric acid concentrations. The objective of the present study was to evaluate the accuracy of EasyTouch uric acid monitoring system. Design and methods: Capillary blood uric acid concentrations measured using EasyTouch and the reference values obtained from COBAS MIRA were performed in the Department of Laboratory Medicine, Wei-Gong Memorial Hospital. Results were evaluated using (1) linear regression analysis, (2) percentage of readings within a defined range of deviation from the reference value, and (3) coefficients of variation (CVs) calculated from 60 measurements in series. Results: The window of the 177 EasyTouch readings covered a wide range from 0.1785 to 0.6367 mmol/L (3-10.7 mg/dL). Linear regression analysis yielded a regression slope of 0.975, an intercept of 0.0118 mmol/L and an R-2 of 0.8966. Of the EasyTouch readings, 64 (36.2%), 61 (34.5%), 34 (19.2%), 9 (5.08%), and 9 (5.08%) were within the intervals of <5%, 5-10%, 10-15%, 15-17%, and >17%, respectively, of the reference values. Further analysis for the performance of each lot of strips showed that both coefficients of correlation and the percentages of readings within the CLIA's criterion (+/-17%), respectively, were in a narrow range from 0.8777 to 0.9541 and from 92.1% to 100%. The CVs for the seven lots of strips (lot I to lot 7) ranged from 2.93% to 6.33%, 3.2% to 5.9%, 3.64% to 7.0%, 2.84% to 7.6%, 2.68% to 5.42%, 3.03% to 6.93%, and 3.18% to 5.17%, respectively. Conclusion: EasyTouch is an acceptable diagnostic device which provides accurate uric acid measurements. (C) 2004 The Canadian Society of Clinical Chemists. All rights reserved.Item type:Item, An event-driven framework for inter-user communication applications(2006-07-01) ;Hsu, CC ;Wu, IC ;資訊工程學系Department of Computer ScienceThis paper presents an event-driven framework for inter-user communication applications, such as Internet gaming or chatting, that require frequent communication among users. This paper addresses two major blocking problems for event-driven programming for inter-user communication applications, namely output blocking and request blocking. For the former, an output buffering mechanism is presented to solve this problem. For the latter, a service requesting mechanism with helper processes is presented to solve this problem. The above two mechanisms are incorporated into the framework presented in this paper to facilitate application development. In practice, this framework has been applied to online game development. (C) 2005 Elsevier B.V. All rights reserved.Item type:Item, Broad multiwavelength second-harmonic generation from two-dimensional chi((2)) nonlinear photonic crystals of tetragonal lattice structure(2004-09-01) ;Peng, LH ;Hsu, CC ;Kung, AH ;交大名義發表National Chiao Tung UniversityWe investigate the effects of lattice spacing and domain-filling ratio on the wavelength dependence in second-harmonic generation (SHG) from two-dimensional chi((2)) nonlinear photonic crystals (2-D NPC) on lithium niobate. Spectral coverage of 150 and 200 nm around 1.5 and 1.9 mum in quasi-phase-matched (QPM) SHG is obtained by angular rotation of the NPC with a lattice periodicity of 20 x 20 and 29.5 x 29.5 mum(2), respectively. The SHG signals are shown to have off-axial propagation directions determined by the incident wavelength and the QPM vector. The intensity of the high-order reciprocal-lattice-vector (G(mn))-assisted SHG signal is shown to depend on the domain-filling ratio. These observations are attributed to the unique dispersion of G(mn) together with the nonzero chi((2)) (G(mn)) nonlinearity in the 2-D QPM-NPC having a tetragonal lattice structure.Item type:Item, Data transformation in SPC for semiconductor machinery control: A case of monitoring particles(2005-07-01) ;Chen, MC ;Su, CT ;Hsu, CC ;Liu, YW工業工程與管理學系Yield is an important indicator of productivity in semiconductor manufacturing. In the complex manufacturing process, the particles on wafers inevitably cause defects, which may result in chip failure and thus reduce yield. Semiconductor manufacturers initially use wafer testing to control the machine for the number of particles. This machinery control procedure aims to detect any unusual condition of machines, reduce defects in actual wafer production and thus improve yield. In practice, the distribution of particles does not usually follow a Poisson distribution, which causes an overly high rate of false alarms in applying the c-chart. Consequently, the semiconductor machinery cannot be appropriately controlled by the number of particles on machines. This paper primarily combines data transformation with the control chart based on a Neyman type- A distribution to develop a machinery control procedure applicable to semiconductor machinery. The proposed approach monitors the number of particles on the testing wafer of machines. A semiconductor company in Taiwan in the Hsinchu Science Based Industrial Park demonstrated the feasibility of the proposed method through the implementation of several machines. The implementation results indicated that the occurrence of false alarms declined extensively from 20% to 4%.Item type:Item, Effective approaches for low temperature polysilicon TFT LCD post-mapping yield control problem(2005-04-01) ;Su, CT ;Wang, PS ;Hsu, CC ;工業工程與管理學系Department of Industrial Engineering and ManagementLow-temperature polysilicon (LTPS) technology has drawn the attention of many display manufacturers because it has several potential advantages over amorphous thin-film-transistor liquid crystal display (TFT LCD). The mapping operation matches one TFT and one color-filter (CF) glass plate together to form one LCD plate. Each plate contains a certain number of cells that are independent devices. The matched LCD cell is good only when the TFT and CF cell match is good. When only a TFT or CF cell is good, there is a yield loss. The sorter is a robot used in LCD manufacturing systems to achieve higher yield in matching TFT and CF plates. This sorter contains several ports that can transfer CF glasses from CF cassettes to match TFT glasses. This is an important determinant for post-mapping yield. This study first proposes a linear programming formulation to optimize the plates-matching problem for the various ports. Next, we propose an algorithm to reduce the number of ways for choosing different matched objects when the number of matched cassettes is large. This algorithm avoids computer overload and provides an excellent solution. The empirical results illustrate the efficiency and effectiveness of the proposed approaches.Item type:Item, Fabrication of sub-60-nm contact holes in silicon dioxide layers(2004-06-01) ;Ko, FH ;You, HC ;Chu, TC ;Lei, TFHsu, CCWe have developed a fabrication technique, comprising electron-beam writing, chemical shrinking, and silicon dioxide etching, for the fabrication of sub-60-nm contact holes. The dimensions of the contact holes after the electron-beam writing, chemical shrinkage, and plasma etching steps were 140, 93, and 53 nm, respectively. We carefully evaluated the critical process parameters, such as mixing-bake temperature, mixing-bake time, plasma etch selectivity, and the profile shapes. A higher mixing-bake temperature led to an overhang of the contact hole in the resist; the optimal mixing-bake conditions occur when heating at 110 degreesC for 70 s. A fluorinated mixture of gases (CHF3/CF4 = 1:1) was used to etch the nano-scale contact holes in the silicon dioxide layer. The formation of side-wall polymers during the plasma etch phase contributed further to the contact hole shrinkage in addition to resist chemical shrinkage. The ratio of the hole's perimeter to its area affects the shrinkage dimensions of the etch process, especially for smaller contact holes. The pattern reduction due to side-wall polymer deposition in etch process has the inverse relationship with the diameter of contact hole. (C) 2004 Elsevier B.V. All rights reserved.Item type:Item, Hyper-Rayleigh scattering of thiophene-incorporated polyene chromophores with pi-configuration locking(1997-08-15) ;Hsu, CC ;Shu, CF ;Huang, TH ;Wang, CHLin, JLThe hyper-Rayleigh scattering (HRS) technique is used to determine and compare the first hyperpolarizabilities (beta) of thiophene-incorporated polyene chromophores with and without a configuration locked trans-triene bridge, To ensure the purity of the HRS signal, special attention is paid to its dependence on the fundamental intensity and the spectral content of the scattered radiation including the two-photon absorption induced fluorescence. From the HRS results, it is found that the configuration-locked trans-triene bridge enhances the beta values of the chromophores studied, The beta-enhancement is more pronounced when the electron acceptor CHC(CN)(2) in the chromophores is replaced with C-2(CN)(3). (C) 1997 Elsevier Science B.V.Item type:Item, Identification of thin metal film on surface plasma resonance probe by using heterodyne interferometry(2002) ;Hsu, CC ;Chen, KH ;Su, DC ;光電工程學系Department of PhotonicsA light beam coming from a heterodyne light source and is divided into three parts by two beam-splitters. Two parts are guided to be incident on the thin metal film on a surface plasma resonance (SPR) probe from two other sides. Two groups of multiple reflected beams occur in the thin metal film, they pass through their corresponding analyzer and lens, and are detected by the associated photodetectors. So we have two test signals. On the other hand, the other part passes through an analyzer and enters a photodetector. The intensity measured by the photodetector is the reference signal. These two test signals and the reference signal are send to a phase meter, the phase differences between the test signals and the reference signal can be obtained. Substituting these data into the special equations derived from Fresnel's equations and the principle of multiple beam interference, the complex refractive index and the thickness of the thin metal film of the probe can be estimated. Because of its common path optical configuration and its heterodyne interferometric phase measurement, this method has many merits, such as, high stable against the surrounding vibration, high resolution, real time operation. In addition, four samples are tested to show the validity of this method.