Browsing by Author "Jian, W. B."
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Item type:Item, Cross-sectional shape modulation of physical properties in ZnO and Zn(1-x)Co(x)O nanowires(2008-03-12) ;Wu, Z. Y. ;Chen, I. J. ;Lin, Y. F. ;Chiu, S. P.Chen, F. R.We have prepared comparable-diameter ZnO and Zn(1-x)Co(x)O nanowires with both circular and hexagonal cross-sections. The average diameters are similar to 113 and similar to 134 nm for cylindrical and hexagonal nanowires, respectively. The as-grown nanowires have been characterized via structure, electrical conductivity and photoluminescence (PL) spectrum measurements. Pure ZnO nanowires were Co-ion implanted to make magnetic Zn(1-x)Co(x)O nanowires for magnetization studies. Bumpier edge surfaces on a nanometre scale, higher densities of stacking faults and a bending feature along the growth direction have been found in cylindrical ZnO nanowires. As compared with hexagonal nanowires, we have observed relatively higher conductivities in cylindrical nanowires, which implied large numbers of shallow donors existing in the latter nanowires. The cylindrical ZnO nanowires also displayed intensified green defect emission and considerably more stacking faults in the crystalline structure. In addition, we have found increased magnetization and stronger ferromagnetic ordering in cylindrical than in hexagonal Zn(1-x)Co(x)O nanowires, and have experimentally identified that the point defects of either Zn interstitials or O vacancies played governing roles in ferromagnetism. We conclude that the cross-sectional shape effect originating a varied point defect density can profoundly modulate the structural, electrical, optical as well as magnetic properties of ZnO and Zn(1-x)Co(x)O nanowires.Item type:Item, Determination of contact and intrinsic nanowire resistivity in two-contact ZnO nanowire devices(2008) ;Lin, Y. F. ;Jian, W. B. ;Wu, Z. Y. ;Chen, F. R.Kai, J. J.Cylindrical ZnO nanowires were synthesized to fabricate two-contact ZnO nanowire devices with the same separation distance between the two contact electrodes. Electrical properties including temperature dependence of resistance and I-V curves were recorded. According to distinct electrical behaviors and room-temperatare resistance, ZnO nanowire devices can be categorized into three different types exhibiting either contact or intrinsic NW attributes.Item type:Item, Electrical transport studies of individual IrO(2) nanorods and their nanorod contacts(2008-01-30) ;Lin, Y. H. ;Sun, Y. C. ;Jian, W. B. ;Chang, H. M.Huang, Y. S.We have studied the electrical transport properties of individual single-crystalline IrO(2) nanorods prepared by the metal-organic chemical vapour deposition method. With the help of the standard electron-beam lithographic technique, individual nanorods are contacted by Cr/Au submicron electrodes from above. Utilizing two-probe, three-probe and four-probe measurement configurations, not only the intrinsic electrical transport properties of the individual nanorods but also the electronic contact resistances, Rc(T), have been determined from 300 K down to liquid-helium temperatures. Our measured resistivity behaviour of the nanorods is in close agreement with the current theoretical understanding of this rutile material. On the other hand, we found that the temperature behaviour of the electronic contact resistance obeys the law log R(C) alpha T(-1/2) over an extremely wide temperature range, from approximately 100 K down to liquid-helium temperatures. This latter conduction process is ascribed to the hopping of electrons through nanoscale Cr granules and/or an amorphous coating incidentally formed at the interface between the submicron Cr/Au electrode and the nanorod.Item type:Item, Electrical transport studies of individual IrO2 nanorods and their nanorod contacts(2008-01-30) ;Lin, Y. H. ;Sun, Y. C. ;Jian, W. B. ;Chang, H. M.Huang, Y. S.We have studied the electrical transport properties of individual single-crystalline IrO2 nanorods prepared by the metal-organic chemical vapour deposition method. With the help of the standard electron-beam lithographic technique, individual nanorods are contacted by Cr/Au submicron electrodes from above. Utilizing two-probe, three-probe and four-probe measurement configurations, not only the intrinsic electrical transport properties of the individual nanorods but also the electronic contact resistances, Rc(T), have been determined from 300 K down to liquid-helium temperatures. Our measured resistivity behaviour of the nanorods is in close agreement with the current theoretical understanding of this rutile material. On the other hand, we found that the temperature behaviour of the electronic contact resistance obeys the law log R-C alpha T-1/2 over an extremely wide temperature range, from approximately 100 K down to liquid-helium temperatures. This latter conduction process is ascribed to the hopping of electrons through nanoscale Cr granules and/or an amorphous coating incidentally formed at the interface between the submicron Cr/Au electrode and the nanorod.Item type:Item, Fabrication, characterization and studies of annealing effects on ferromagnetism in Zn1-xCoxO nanowires(2006-11-14) ;Wu, Z. Y. ;Chen, F. R. ;Kai, J. J. ;Jian, W. B.Lin, J. J.Diluted magnetic semiconductor Zn1-xCoxO ( x <= 0.11) nanowires with average diameter of similar to 40 nm were prepared by thermal evaporation, followed by high-energy Co ion implantation. Bombardment by Co ions produced a good number of structural defects (stacking faults and orientational variations) in the nanowires. The as-implanted nanowires were paramagnetic. We performed two types of thermal annealing, one in 1 atm argon flow and the other in a high vacuum, at 600 degrees C, and studied the effects of annealing on the magnetic properties of these nanowires. Argon annealing removed structural defects in the nanowires and the nanowires then revealed ferromagnetic ordering. This result suggests that structure defects are harmful to the occurrence of ferromagnetism in the Co- implanted ZnO. The structure of the as-implanted and the annealed nanowires was inspected in detail by using scanning electron microscopy, energy dispersive x-ray spectroscopy, maps of electron energy loss spectra, x-ray diffraction, and high-resolution transmission electron microscopy. Taken together, these studies suggested that no second phase existed on the scale down to the spatial resolution of similar to 0.5 nm. Noticeably, the nanowires even displayed largely enhanced ferromagnetism after annealing in a high vacuum. A subsequent annealing in oxygen has also been performed on those vacuum-annealed nanowires to study the roles played by the O vacancies in determining the ferromagnetic properties of the nanowires. Our results indicate that both the improved structural quality and the increased number of O vacancies are key factors for the occurrence of ferromagnetic ordering in the Zn1-xCoxO nanowires.Item type:Item, Methods of determining the contact between a probe and a surface under scanning electron microscopy(2006-10-01) ;Nien, C. -H. ;Tsai, C. H. ;Shin, K. Y. ;Jian, W. B.電子物理學系Based on the charging effect common to various kinds of electron microscopy, we have developed novel methods of determining "when" and "where" a probe starts to contact an electrically isolated surface. The touchdown of an electrically grounded probe leads to an acute change in the imaging contrast of the contacted surface, which also causes a rapid jump (ranging from a few to tens of picoamperes) of the grounding current. Thus, the detection of contact can be carried out in both qualitative and quantitative manners, providing a basis for establishing relevant standard procedures. In addition, we have achieved the spatial mapping of the contact point(s) using a specially designed lithographical pattern with two mutually vertical sets of parallel conductive lines. The precision of this mapping technique is simply determined by the pitch of parallel lines, which can be as small as the capability achievable in e-beam lithography. A possible "one-probe" version of the electrical characterization is also discussed with the same underlying principle, which may turn out to be indispensable for various studies and applications of nanostructures. Further development along this track is promising to realize an instrumentally simple version of "scanning electronspectroscopy" with various modes. (c) 2006 American Institute of Physics.Item type:Item, Nanocontact resistance and structural disorder induced resistivity variation in metallic metal-oxide nanowires(2009-11-11) ;Lin, Y. F. ;Wu, Z. Y. ;Lin, K. C. ;Chen, C. C.Jian, W. B.Several systems of metallic metal-oxide nanowires (NWs), including pure RuO(2) and as-implanted and annealed Ru(0.98)Cu(0.02)O(2) and Ru(0.93)Cu(0.07)O(2) NWs, have been employed in two-probe electrical characterizations by using a transmission electron microscope-scanning tunneling microscope technique with a gold tip. Thermal, mechanical, and electron beam exposing treatments are consecutively applied to reduce the electrical contact resistance, generated from the interface between the NW and the gold tip, so as to evaluate the intrinsic NW resistance. It is found that the residual contact resistance cannot be entirely removed. For each system of metallic metal-oxide NWs, several tens of NWs are applied to electrical characterizations and the total resistances unveil a linear dependence on the ratio of the length to the area of the NWs. As a result, the average resistivity and the contact resistance of the metallic metal-oxide NWs could be evaluated at room temperatures. The average resistivities of pure RuO(2) NWs agree well with the results obtained from standard two- and four-probe electrical-transport measurements. In addition, the as-implanted Cu-RuO(2) NWs reveal disordered crystalline structures in high-resolution TEM images and give higher resistivities in comparison with that of pure RuO(2) NWs. The residual contact resistances of all kinds of metallic metal-oxide NWs unveil, more surprisingly, an approximation value of several kilohms, even though the average resistivities of these NWs change by more than one order of magnitude. It is argued that the ductile gold tip makes one or more soft contacts on the stiff metal-oxide NWs with nanometer roughness and the nanocontacts on the NWs contribute to the electrical contact resistance.Item type:Item, Size dependence in tunneling spectra of PbSe quantum-dot arrays(2009-07-15) ;Ou, Y. C. ;Cheng, S. F. ;Jian, W. B. ;電子物理學系物理研究所Interdot Coulomb interactions and collective Coulomb blockade were theoretically argued to be a newly important topic, and experimentally identified in semiconductor quantum dots, formed in the gate confined two-dimensional electron gas system. Developments of cluster science and colloidal synthesis accelerated the studies of electron transport in colloidal nanocrystal or quantum-dot solids. To study the interdot coupling, various sizes of two-dimensional arrays of colloidal PbSe quantum dots are self-assembled on flat gold surfaces for scanning tunneling microscopy and scanning tunneling spectroscopy measurements at both room and liquid-nitrogen temperatures. The tip-to-array, array-to-substrate, and interdot capacitances are evaluated and the tunneling spectra of quantum-dot arrays are analyzed by the theory of collective Coulomb blockade. The current-voltage of PbSe quantum-dot arrays conforms properly to a scaling power law function. In this study, the dependence of tunneling spectra on the sizes (numbers of quantum dots) of arrays is reported and the capacitive coupling between quantum dots in the arrays is explored.