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Browsing by Author "LUR, W"

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    BOND-STRUCTURE CHANGES OF LIQUID-PHASE DEPOSITED OXIDE (SIO2-XFX) ON N2 ANNEALING
    (1995-02-20)
    YEH, CF
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    CHEN, CL
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    LUR, W
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    YEN, PW
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    電子工程學系及電子研究所
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    INTERFACIAL REACTIONS OF TITANIUM THIN-FILMS ON ION-IMPLANTED (001) SI
    (1993-04-01)
    LIAUH, HR
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    CHEN, MC
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    CHEN, JF
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    CHEN, LJ
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    LUR, W
    An investigation on the influences of doping impurities on the formation of titanium silicide has been carried out. The formation of polycrystalline silicide was observed to be retarded by the presence of As in Ti/As+-Si samples compared with those in Ti/BF2+-Si samples. Superior thermal stability of TiSi2 was found to occur in BF2+ implanted samples than that in blank and As+ implanted samples. The resistance to island formation in BF2+ implanted samples is attributed to the retardation of grain growth by the segregation of fluorine atoms at the grain boundaries.