BOND-STRUCTURE CHANGES OF LIQUID-PHASE DEPOSITED OXIDE (SIO2-XFX) ON N2 ANNEALING

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1995-02-20

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10.1063/1.113603

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http://dx.doi.org/10.1063/1.113603
 https://ir.lib.nycu.edu.tw/handle/11536/2045

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期刊論文;;Articles

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