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Browsing by Author "Tseng, Tzu-Yi"

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    Study on degradation of crystallized laterally grown poly-Si TFT under Dynamic Stress
    (2007)
    Lu, Hau-Yan
    ;
    Chung, Wan-Fang
    ;
    Tseng, Tzu-Yi
    ;
    Chen, Yu-Cheng
    ;
    Liu, Po-Tsun
    The influence of protrusion grain boundary on the degradation of crystallized laterally grown poly-Si TFT under Dynamic Stress is investigated. The degradation of TFT with protrusion grain boundary is more severe and the different damage of the source/drain junction in the TFT with grain boundary closed to source side.