Browsing by Author "Tso, Chia-Tsung"
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Item type:Item, Gate-all-around poly-Si nanowire junctionless thin-film transistors with multiple channels(2015-06-01) ;Tso, Chia-Tsung ;Liu, Tung-Yu ;Sheu, Jeng-Tzong ;材料科學與工程學系Department of Materials Science and EngineeringPolycrystalline silicon (poly-Si) nanowire (NW) junctionless (JL) thin-film transistors composed of gate-all-around (GAA) and multiple channels were demonstrated and characterized. The high surface-to-volume ratio of the NW and a nominal gate length of 0.25 mu m lead to a clear improvement in electrical performance, including a steep subthreshold swing (SS; similar to 124 mV/decade), a virtual absence of drain-induced barrier lowering (DIBL; 21 +/- 13 mV/V), and a high I-ON/I-OFF current ratio (similar to 1 x 10(9)) under a relatively low voltage condition (V-D = 0.3 V, V-G = 5 V), resulting from the multiple-channel structure and small grain boundaries and defects under the gate area. (C) 2015 The Japan Society of Applied PhysicsItem type:Item, Temperature- and doping-concentration-dependent characteristics of junctionless gate-all-around polycrystalline-silicon thin-film transistors(2017-04-01) ;Tso, Chia-Tsung ;Liu, Tung-Yu ;Pan, Fu-Ming ;Sheu, Jeng-Tzong材料科學與工程學系The temperature effects of both gate-all-around polycrystalline silicon nanowire (GAA poly-Si NW) junctionless (JL) and inversion mode (IM) transistor devices at various temperatures (77-410 K) were investigated. The electrical characteristics of these devices, such as subthreshold swing (SS), threshold voltage (Vth), and drain-induced barrier lowering (DIBL), were also characterized and compared in this study. Moreover, JL devices with different doping concentrations at various temperatures were also discussed. Both Vth and I-on showed significant doping concentration dependences for JL devices with doping concentrations of 1 x 10(19) and 5 x 10(19) cm(-3). However, the electrical characteristics of JL devices showed less thermal sensitivity when the doping concentration reached 10(20) cm(-3) . (C) 2017 The Japan Society of Applied Physics