Browsing by Author "Wen-Yi"

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High-voltage tolerant power rail electrostatic discharge clamp circuit
(2007-10-16)
Ker
;
Ming-Dou
;
Chen
;
Wen-Yi
A high-voltage tolerant power-rail ESD clamp circuit is proposed, in which circuit devices can safely operate under the high power supply voltage that is three times larger than their process limitation without gate-oxide reliability issue. Moreover, an ESD detection circuit is used to effectively improve the whole ESD protection function by substrate-triggered technique. Because only low voltage (1*VDD) devices are used to achieve the object of high voltage (3*VDD) tolerance, the proposed design provides a cost effective power-rail ESD protection solution to chips with mixed-voltage interfaces.