探針式熱電功率因子量測系統之研發
Abstract
近年來由於綠色能源工業的快速成長，熱電材料因而再度受到學界及業界的重視。
拜奈米科技的進步及熱電相關新理論的發展，越來越多的高優值係數熱電材料相繼
被發現。鑑於日益增加之熱電材料性質量測需求，本研究計畫提出一種整合型高效
率熱電功率因子量測系統；此系統主要結合「變溫四點探針量測系統」以及「紅外
線熱影像儀」。此系統除了能夠符合材料多樣性之需求，可在不同溫度之下量測各
式尺寸及材料種類（塊材到薄膜）之熱電功率因子。其可即時移動之探針亦能精確
提供不同區塊位置之平均熱電功率因子。
Thermoelectric materials have recently reattracted much attention due to the rapid growth of various clean-energy industries. With the great development of nanotechnologies and new concepts, a series of novel thermoelectric materials with comparable high figure of merit have been widely discovered. For the urgent demand of the effect measurement of the thermoelectric power factor, a unique characterization system which combines high-temperature four-probe electrical measurement and infared thermography technique are newly proposed. This system can be applied to various materials from bulk to thin films with a wide range of specimen size under different temperatures. The dynamic movement of the probes can also provide accurate averaged results obtained from differnet regions selected.
Thermoelectric materials have recently reattracted much attention due to the rapid growth of various clean-energy industries. With the great development of nanotechnologies and new concepts, a series of novel thermoelectric materials with comparable high figure of merit have been widely discovered. For the urgent demand of the effect measurement of the thermoelectric power factor, a unique characterization system which combines high-temperature four-probe electrical measurement and infared thermography technique are newly proposed. This system can be applied to various materials from bulk to thin films with a wide range of specimen size under different temperatures. The dynamic movement of the probes can also provide accurate averaged results obtained from differnet regions selected.