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dc.contributor.authorHo, Jen_US
dc.contributor.authorHwang, WLen_US
dc.contributor.authorLu, HHSen_US
dc.contributor.authorLee, DTen_US
dc.date.accessioned2014-12-08T15:17:29Z-
dc.date.available2014-12-08T15:17:29Z-
dc.date.issued2006-02-01en_US
dc.identifier.issn1057-7149en_US
dc.identifier.urihttp://dx.doi.org/10.1109/TIP.2005.860610en_US
dc.identifier.urihttp://hdl.handle.net/11536/12676-
dc.description.abstractWe use an optimization technique to accurately locate a distorted grid structure in a microarray image. By assuming that spot centers deviate smoothly from a checkerboard grid structure, we show that the process of gridding spot centers can be formulated as a constrained optimization problem. The constraint is equal to the variations of the transform parameter. We demonstrate the accuracy of our algorithm on two sets of microarray images. One set consists of some images from the Stanford Microarray Database; we compare our centers with those annotated in the Database. The other set consists of oligonucleotide images, and we compare our results with those obtained by GenePix Pro 5.0. Our experiments were performed completely automatically.en_US
dc.language.isoen_USen_US
dc.subjectmicroarray imageen_US
dc.subjectspot griddingen_US
dc.titleGridding spot centers of smoothly distorted microarray imagesen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/TIP.2005.860610en_US
dc.identifier.journalIEEE TRANSACTIONS ON IMAGE PROCESSINGen_US
dc.citation.volume15en_US
dc.citation.issue2en_US
dc.citation.spage342en_US
dc.citation.epage353en_US
dc.contributor.department統計學研究所zh_TW
dc.contributor.departmentInstitute of Statisticsen_US
dc.identifier.wosnumberWOS:000234761400008-
dc.citation.woscount6-
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