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dc.contributor.authorLi, Zipengen_US
dc.contributor.authorLai, Kelvin Yi-Tseen_US
dc.contributor.authorYu, Po-Hsienen_US
dc.contributor.authorChakrabarty, Krishnenduen_US
dc.contributor.authorHo, Tsung-Yien_US
dc.contributor.authorLee, Chen-Yien_US
dc.date.accessioned2017-04-21T06:49:24Z-
dc.date.available2017-04-21T06:49:24Z-
dc.date.issued2016en_US
dc.identifier.isbn978-1-4673-8773-6en_US
dc.identifier.issn1089-3539en_US
dc.identifier.urihttp://hdl.handle.net/11536/134539-
dc.description.abstractA digital microfluidic biochip (DMFB) is an attractive platform for immunoassays, point-of-care clinical diagnostics, DNA sequencing, and other laboratory procedures in biochemistry. However, today\'s DMFBs suffer from several limitations, including (i) the lack of integrated sensors for real-time detection, (ii) constraints on droplet size and the inability to vary droplet volume in a fine-grained manner, and (iii) the need for special fabrication processes and the associated reliability/yield concerns. To overcome the above limitations, DMFBs based on a micro-electrode-dot-array (MEDA) architecture have been proposed recently. Droplet manipulation on MEDA biochips has also been experimentally demonstrated. In order to ensure robust fluidic operations and high confidence in the outcome of biochemical experiments, MEDA biochips must be adequately tested before they can be used for bioassay execution. We present an efficient built-in self-test (BIST) architecture for MEDA biochips. The proposed BIST architecture can effectively detect defects in a MEDA biochip, and faulty microcells can be identified. Simulation results based on HSPICE and experiments using fabricated MEDA biochips highlight the effectiveness of the proposed BIST architecture.en_US
dc.language.isoen_USen_US
dc.titleBuilt-In Self-Test for Micro-Electrode-Dot-Array Digital Microfluidic Biochipsen_US
dc.typeProceedings Paperen_US
dc.identifier.journalPROCEEDINGS 2016 IEEE INTERNATIONAL TEST CONFERENCE (ITC)en_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.identifier.wosnumberWOS:000392655800027en_US
dc.citation.woscount0en_US
Appears in Collections:Conferences Paper