| 標題: | The polarity bias control of Indium Zinc Oxide Thin Film Transistor for gas sensor application |
| 作者: | Teng, Li-fang Liu, Po-Tsun Chou, Yi-Teh Fan, Yang-Shun 光電工程學系 顯示科技研究所 Department of Photonics Institute of Display |
| 公開日期: | 2010 |
| 摘要: | An obvious Vth shift was observed after gate-bias stress and recovered. This metastability was attributed to the interaction between the exposed a-IZO backchannel and oxygen/moisture from the atmosphere, regardless of the polarity of stress voltage. This water/moisture sensitivity characteristic can be used for gas sensor application. |
| URI: | http://hdl.handle.net/11536/135573 |
| ISSN: | 1883-2490 |
| 期刊: | IDW'10: PROCEEDINGS OF THE 17TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3 |
| 起始頁: | 253 |
| 結束頁: | 255 |
| Appears in Collections: | Conferences Paper |
- Charge pumping method for photosensor application by using amorphous indium-zinc oxide thin film transistors / Liu, Po-Tsun;Chou, Yi-Teh;Teng, Li-Feng
- Influences of Nitrogen Doping on the Electrical Characteristics of Indium-Zinc-Oxide Thin Film Transistors / Han, Yanbing;Yan, Hai;Tsai, Yun-Chu;Li, Yan;Zhang, Qun
- The Influence of Annealing Temperature on Amorphous Indium-Zinc-Tungsten Oxide Thin-Film Transistors / Fu, Ruofan;Yang, Jianwen;Chang, Wei-Chiao;Chang, Wei-Cheng;Chang, Chien-Min
- Bias-induced oxygen adsorption in zinc tin oxide thin film transistors under dynamic stress / Chen, Yu-Chun;Chang, Ting-Chang;Li, Hung-Wei;Chen, Shih-Ching;Lu, Jin
- Degradation of a-IGZO Thin-Film Transistors Under Negative Bias and Illumination Stress in the Time Span of a Few Seconds / Tai, Y. -H.;Liu, H. -W.;Chan, P. -C.;Chiu, S. -L.
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