Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Lee, Shih-Wei | en_US |
dc.contributor.author | Chang, Geng-Ming | en_US |
dc.contributor.author | Chang, Ching-Yun | en_US |
dc.contributor.author | Chen, Kuan-Neng | en_US |
dc.date.accessioned | 2019-04-03T06:44:29Z | - |
dc.date.available | 2019-04-03T06:44:29Z | - |
dc.date.issued | 2017-03-01 | en_US |
dc.identifier.issn | 2168-6734 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/JEDS.2017.2649605 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/145453 | - |
dc.description.abstract | A sealing redistribution layer (RDL) approach for the interposer fabrication is developed to simplify the conventional bottom-up process flow. By using this approach, bottom-up plating can achieve the integration of Cu-filler plating and its bottom RDL simultaneously. In this paper, through-glass via in glass interposer or 3-D integration is fabricated using the proposed approach. The electrical measurement and reliability tests indicate that the proposed approach can be an attractive candidate for interposer fabrication with great performance. | en_US |
dc.language.iso | en_US | en_US |
dc.subject | Through-Glass via (TGV) | en_US |
dc.subject | redistribution layer | en_US |
dc.subject | glass interposer | en_US |
dc.subject | 3D integration | en_US |
dc.title | A Novel Sealing Redistribution Layer Approach for Through-Glass via Fabrication | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1109/JEDS.2017.2649605 | en_US |
dc.identifier.journal | IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY | en_US |
dc.citation.volume | 5 | en_US |
dc.citation.issue | 2 | en_US |
dc.citation.spage | 132 | en_US |
dc.citation.epage | 135 | en_US |
dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
dc.identifier.wosnumber | WOS:000400467500007 | en_US |
dc.citation.woscount | 3 | en_US |
Appears in Collections: | Articles |
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