標題: A novel approach for functional coverage measurement in HDL
作者: Liu, CNJ
Chang, CY
Jou, JY
Lai, MC
Juan, HM
交大名義發表
National Chiao Tung University
公開日期: 2000
摘要: While the coverage-driven functional verification is getting popular: a fast and convenient coverage measurement tool is necessary. In this paper, we propose a hovel approach for functional coverage measurement based on the VCD files produced by the simulators. The usage flow of the proposed dumpfile-based coverage analysis is much easier and smoother than that of existing instrumentation-based coverage tools. No pre-processing tool is required and no extra code will be inserted into the source code. Most importantly, the flexibility in choosing coverage metrics and measured code regions is increased. Only one simulation run is needed for any kind of coverage reports. By conducting some experiments on real examples: it shows very promising results in terms of the performance and the accuracy of coverage reports.
URI: http://hdl.handle.net/11536/19197
期刊: ISCAS 2000: IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS - PROCEEDINGS, VOL IV: EMERGING TECHNOLOGIES FOR THE 21ST CENTURY
起始頁: 217
結束頁: 220
顯示於類別:會議論文