標題: | Process-related instability mechanisms for the hydrogenated amorphous silicon thin film transistors |
作者: | Tai, YH Su, FC Feng, MS Cheng, HC 電子工程學系及電子研究所 Department of Electronics Engineering and Institute of Electronics |
公開日期: | 1995 |
URI: | http://hdl.handle.net/11536/20001 |
ISBN: | 7-5053-3285-6 |
期刊: | PROCEEDINGS OF THE FOURTH INTERNATIONAL CONFERENCE ON SOLID-STATE AND INTEGRATED-CIRCUIT TECHNOLOGY |
起始頁: | A730 |
結束頁: | A732 |
顯示於類別: | 會議論文 |