Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Pearn, WL | en_US |
dc.contributor.author | Lin, GH | en_US |
dc.date.accessioned | 2014-12-08T15:41:08Z | - |
dc.date.available | 2014-12-08T15:41:08Z | - |
dc.date.issued | 2003-04-01 | en_US |
dc.identifier.issn | 0026-2714 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1016/S0026-2714(02)00323-2 | en_US |
dc.identifier.uri | http://hdl.handle.net/11536/27990 | - |
dc.description.abstract | Process capability indices C-PU and C-PL are developed in the manufacturing industry to provide quantitative measures on process potential and performance. for processes with one-sided specification limits. Statistical properties of the estimators of C-PU and C-PL have been investigated extensively, but only restricted to cases with single samples. In this paper, we consider the estimation and capability testing of C-PU and C-PL based on multiple samples. We show that the proposed estimator of C-PU and C-PL are indeed the uniformly minimum variance unbiased estimators (UMVUEs). A simple procedure based on a hypothesis testing using the UMVUE is developed for the practitioners to use for judging whether a stable process meets the preset capability requirement. (C) 2002 Elsevier Science Ltd. All rights reserved. | en_US |
dc.language.iso | en_US | en_US |
dc.title | A reliable procedure for testing linear regulators with one-sided specification limits based on multiple samples | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1016/S0026-2714(02)00323-2 | en_US |
dc.identifier.journal | MICROELECTRONICS RELIABILITY | en_US |
dc.citation.volume | 43 | en_US |
dc.citation.issue | 4 | en_US |
dc.citation.spage | 651 | en_US |
dc.citation.epage | 664 | en_US |
dc.contributor.department | 工業工程與管理學系 | zh_TW |
dc.contributor.department | Department of Industrial Engineering and Management | en_US |
dc.identifier.wosnumber | WOS:000182363300018 | - |
dc.citation.woscount | 4 | - |
Appears in Collections: | Articles |
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