| Title: | 亮比式橢圓偏光儀之表面量測---二維系統 Intensity Quotient Ellipsometry and Its Application in Surface Measurement---2D System |
| Authors: | 趙于飛 國立交通大學光電工程研究所 |
| Issue Date: | 2003 |
| Gov't Doc #: | NSC92-2215-E009-055 |
| URI: | http://hdl.handle.net/11536/92453 https://www.grb.gov.tw/search/planDetail?id=873524&docId=167351 |
| Appears in Collections: | Research Plans |
- 利用光彈調制橢圓偏光儀量測楔角 / 徐舜威;Shang-wei Shi;趙于飛;Y. F. Chao
- Photoelastic modulated imaging ellipsometry by stroboscopic illumination technique / Han, CY;Chao, YF
- 光彈調變系統中的角度及其應用 / 王昌國;Charn-Kuo Wang;趙于飛;Yu-Faye Chao
- 光彈調變橢圓術中的角度校正及其應用 / 劉行;Shing Liu;趙于飛;Yu-Faye Chao
- Post flight analysis of the surface plasmon resonance enhanced photoelastic modulated ellipsometry / Chao, Yu-Faye;Han, Chien-Yuan
- 光彈調變式橢圓偏光儀---反射面之效正(I) / 趙于飛
- 橢圓偏光儀之異向晶體量測 / 趙于飛
- The intensity ratio alignment technique in photoelastic modulation ellipsometry and polarimetry / Chao, YF
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