| 標題: | 利用共光程外差干涉術量測複數折射率 The Measurements of the Complex Refractive Index by Using the Common Path Heterodyne Interferometry |
| 作者: | 蘇德欽 SU DER-CHIN 交通大學光電工程研究所 |
| 關鍵字: | 共光程外差干涉術;複數折射率;解析度;Common optical path heterodyne interferometry;Complex refractive index;Resolution |
| 公開日期: | 1999 |
| 官方說明文件#: | NSC88-2112-M009-036 |
| URI: | http://hdl.handle.net/11536/94418 https://www.grb.gov.tw/search/planDetail?id=425920&docId=76040 |
| 顯示於類別： | 研究計畫 |
- 共光程外差干涉儀的原理與其應用之研究 / 邱銘宏;Chiu, Ming-Horng;蘇德欽;Su Der-Chin
- 外差干涉術在量測s-與p-偏光間相位差變化的應用 / 李朱育;Ju-Yi Lee;蘇德欽;Der-Chin Su
- Identification of thin metal film on surface plasma resonance probe by using heterodyne interferometry / Hsu, CC;Chen, KH;Su, DC
- 以旋光外差干涉術測量雙折射晶體之尋常光及非尋常光折射率 / 游展汶;Jan-Wen You;蘇德欽;Der-Chin Su
- Full-field refractive index distribution measurement of a gradient-index lens with heterodyne interferometry / Hsieh, Hung-Chih;Chen, Yen-Liang;Wu, Wang-Tsung;Chang, Wei-Yao;Su, Der-Chin
- A method for measuring the complex refractive index of a turbid medium / Jian, ZC;Lin, JY;Hsieh, PJ;Chen, HW;Su, DC
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