Memcomputing: the Cape of Good Hope
| dc.citation.woscount | 0 | en_US |
| dc.contributor.author | Shi, Yiyu | en_US |
| dc.contributor.author | Chen, Hung-Ming | en_US |
| dc.contributor.department | 電子工程學系及電子研究所 | zh_TW |
| dc.contributor.department | Department of Electronics Engineering and Institute of Electronics | en_US |
| dc.date.accessioned | 2015-07-21T08:31:16Z | |
| dc.date.available | 2015-07-21T08:31:16Z | |
| dc.date.issued | 2014-01-01 | en_US |
| dc.description.abstract | en_US | |
| dc.identifier.isbn | 978-3-9815370-2-4 | en_US |
| dc.identifier.issn | 1530-1591 | en_US |
| dc.identifier.journal | 2014 DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION (DATE) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/125144 | |
| dc.identifier.wosnumber | WOS:000354965500264 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Memcomputing: the Cape of Good Hope | en_US |
| dc.type | Proceedings Paper | en_US |
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