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Current-assisted magnetization switching in submicron permalloy S-shape wires with narrow junctions

dc.citation.epageen_US
dc.citation.issue10en_US
dc.citation.volume97en_US
dc.contributor.authorChen, YCen_US
dc.contributor.authorLin, YAen_US
dc.contributor.authorChen, DCen_US
dc.contributor.authorYao, YDen_US
dc.contributor.authorLee, SFen_US
dc.contributor.authorLiou, Yen_US
dc.contributor.department材料科學與工程學系zh_TW
dc.contributor.departmentDepartment of Materials Science and Engineeringen_US
dc.date.accessioned2014-12-08T15:19:08Z
dc.date.available2014-12-08T15:19:08Z
dc.date.issued2005-05-15en_US
dc.description.abstractWe report the results of the current-assisted magnetization switching in submicron permalloy S-shape wires with narrow junctions (or notches). Domain walls were initially formed and pinned in the vicinity of the notches. Two distinct behaviors are observed in the current-assisted magnetization reversal process. When the applied field is near switching field (Delta H < 7 Oe), the injected current directly switched the wire magnetization, and the needed critical current varied linearly and significantly with the field intensity. In contrast, when the field is relatively far from the switching field (Delta H > 7 Oe), the current only moves the domain wall to a local stable state, and the critical current varied slightly with the field. Moreover, two resistance jumps during current scanning are observed in the cases with magnetization reversals. These results reveal that the current driven effect is closely related to the initial domain states, and are explained by a theoretical model based on spin transfer effect. (c) 2005 American Institute of Physics.en_US
dc.identifier.doi10.1063/1.1850254en_US
dc.identifier.issn0021-8979en_US
dc.identifier.journalJOURNAL OF APPLIED PHYSICSen_US
dc.identifier.urihttp://dx.doi.org/10.1063/1.1850254en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/13714
dc.identifier.wosnumberWOS:000230168500073
dc.language.isoen_USen_US
dc.titleCurrent-assisted magnetization switching in submicron permalloy S-shape wires with narrow junctionsen_US
dc.typeArticle; Proceedings Paperen_US

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