A novel AOI system for OLED panel inspection
| dc.citation.epage | 356 | en_US |
| dc.citation.spage | 353 | en_US |
| dc.citation.volume | 13 | en_US |
| dc.contributor.author | Perng, D. B. | en_US |
| dc.contributor.author | Chen, Y. C. | en_US |
| dc.contributor.author | Lee, M. K. | en_US |
| dc.contributor.department | 工業工程與管理學系 | zh_TW |
| dc.contributor.department | Department of Industrial Engineering and Management | en_US |
| dc.date.accessioned | 2014-12-08T15:25:27Z | |
| dc.date.available | 2014-12-08T15:25:27Z | |
| dc.date.issued | 2005 | en_US |
| dc.description.abstract | Organic light emitting diode (OLED) technology uses substances that emit red, green, blue or white light. An OLED panel consists of stacks of several thin layers of different materials, as such it is not easy to inspect the common OLED defects. In this paper, an auto-optical inspection (AOI) system which can detect such defects effectively and robustly was proposed and developed. The proposed system can also identify, in which layer the defect occurred. Meanwhile, a moving mechanism coupled with a lighting mechanism was proposed and implemented for gabbing clear images. The proposed AOI system would provide great help in improving the OLED production process and the quality control process. | en_US |
| dc.identifier.doi | 10.1088/1742-6596/13/1/081 | en_US |
| dc.identifier.issn | 1742-6588 | en_US |
| dc.identifier.journal | 7th International Symposium on Measurement Technology and Intelligent Instruments | en_US |
| dc.identifier.uri | http://dx.doi.org/10.1088/1742-6596/13/1/081 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/17846 | |
| dc.identifier.wosnumber | WOS:000239879900081 | |
| dc.language.iso | en_US | en_US |
| dc.title | A novel AOI system for OLED panel inspection | en_US |
| dc.type | Proceedings Paper | en_US |