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取樣電路及主從正反器

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber201611524zh_TW
dc.contributor.author周世傑en_US
dc.contributor.author楊家驤en_US
dc.contributor.author劉瑋昌en_US
dc.contributor.author羅其偉en_US
dc.contributor.author詹慶達en_US
dc.date.accessioned2016-12-20T05:04:18Z
dc.date.available2016-12-20T05:04:18Z
dc.date.issued2016-03-16en_US
dc.description.abstract一種取樣電路包含一第一閂鎖、一第二閂鎖以及一訊號轉換偵測器。第一閂鎖設置於一邏輯電路之上游側。第二閂鎖設置於邏輯電路之下游側。第一閂鎖以及第二閂鎖分別依據一參考時脈以及一控制時脈所產生之一觸發時脈切換至彼此狀態相反之一鎖定狀態或一穿透狀態。訊號轉換偵測器用以偵測邏輯電路所輸出之訊號是否錯誤,並輸出相對應之控制時脈。上述之取樣電路可在發生時序錯誤時延遲切換第二閂鎖至鎖定狀態以及切換第一閂鎖至穿透狀態,以正確取樣。zh_TW
dc.identifier.govdocH03K005/13zh_TW
dc.identifier.govdocH03K003/037zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/132260
dc.language.isozh_TWen_US
dc.title取樣電路及主從正反器zh_TW
dc.typePatentsen_US

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