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Suspended nanochannel transistor structure and method for fabricating the same

dc.citation.patentcountryUSAzh_TW
dc.citation.patentnumber07977755zh_TW
dc.contributor.authorLin Horng-Chihen_US
dc.contributor.authorSu Chun-Jungen_US
dc.contributor.authorHsu Hsing-Huien_US
dc.contributor.authorLi Guan-Jangen_US
dc.date.accessioned2014-12-16T06:14:18Z
dc.date.available2014-12-16T06:14:18Z
dc.date.issued2011-07-12en_US
dc.description.abstractThe present invention discloses a suspended nanochannel transistor structure and a method for fabricating the same. The transistor structure of the present invention comprises a substrate; a side gate formed on the substrate; a dielectric layer covering the substrate and the side gate; a suspended nanochannel formed beside the lateral of the side gate with an air gap existing between the suspended nanochannel and the dielectric layer; a source and a drain formed over the dielectric layer and respectively arranged at two ends of the suspended nanochannel. The electrostatic force of the side gate attracts or repels the suspended nanochannel and thus fast varies the equivalent thickness of the side-gate dielectric layer. Thereby, the on/off state of the element is rapidly switched, or the initial voltage of the channel is altered.zh_TW
dc.identifier.govdocH01L021/02zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/104651
dc.language.isozh_TWen_US
dc.titleSuspended nanochannel transistor structure and method for fabricating the samezh_TW
dc.typePatentsen_US

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