運用掃描式探針顯微鏡研製與分析矽奈米電子元件(III)
| dc.contributor.author | 許鉦宗 | en_US |
| dc.contributor.author | SHEU JENG TZONG | en_US |
| dc.contributor.department | 國立交通大學奈米科技研究所 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:30:23Z | |
| dc.date.available | 2014-12-13T10:30:23Z | |
| dc.date.issued | 2005 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC94-2215-E009-083 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=1144752&docId=219643 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/90203 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | 運用掃描式探針顯微鏡研製與分析矽奈米電子元件(III) | zh_TW |
| dc.title | Fabrication and Characterization of Silicon Nanoelectronic Devices with Scanning Probe Microscope(III) | en_US |
| dc.type | Plan | en_US |
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