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STRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE STRUCTURE

dc.citation.patentcountryUSAen_US
dc.citation.patentnumber20170222044en_US
dc.contributor.authorSteve S. CHUNGen_US
dc.contributor.authorE-Ray HSIEHen_US
dc.contributor.authorYi-Hsien LINen_US
dc.date.accessioned2019-04-11T05:47:35Z
dc.date.available2019-04-11T05:47:35Z
dc.date.issued2017-08-03en_US
dc.description.abstractStructures and formation methods of a semiconductor device structure are provided. The semiconductor device structure includes a source structure at least partially in a semiconductor substrate. The semiconductor device structure also includes a channel structure over the semiconductor substrate. The source structure is partially covered by the channel structure. The semiconductor device structure further includes a drain structure covering the channel structure. The drain structure and the source structure have different conductivity types. A portion of the channel structure is sandwiched between the source structure and the drain structure. In addition, the semiconductor device structure includes a gate stack partially covering the channel structure.en_US
dc.identifier.govdocH01L029/78en_US
dc.identifier.govdocH01L029/66en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/151295
dc.language.isoen_USen_US
dc.titleSTRUCTURE AND FORMATION METHOD OF SEMICONDUCTOR DEVICE STRUCTUREen_US
dc.typePatentsen_US

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