次微米元件可靠性量測技術整合及其應用

dc.contributor.author	陳明哲	en_US
dc.contributor.department	國立交通大學電子研究所	zh_TW
dc.date.accessioned	2014-12-13T10:40:58Z
dc.date.available	2014-12-13T10:40:58Z
dc.date.issued	1993	en_US
dc.description.sponsorship	行政院國家科學委員會	zh_TW
dc.identifier.govdoc	NSC82-0404-E009-232	zh_TW
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=45948&docId=6595	en_US
dc.identifier.uri	https://ir.lib.nycu.edu.tw/handle/11536/98023
dc.language.iso	zh_TW	en_US
dc.title	次微米元件可靠性量測技術整合及其應用	zh_TW
dc.title	Characterization Integration for Submicron Device Reliability and Its Applications	en_US
dc.type	Plan	en_US

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