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Electron-electron interaction dominated quantum transport in thick CuGe films

dc.citation.epage1182en_US
dc.citation.issueen_US
dc.citation.spage1181en_US
dc.citation.volume284en_US
dc.contributor.authorHsu, SYen_US
dc.contributor.authorShen, FJen_US
dc.contributor.authorLin, JJen_US
dc.contributor.department電子物理學系zh_TW
dc.contributor.department物理研究所zh_TW
dc.contributor.departmentDepartment of Electrophysicsen_US
dc.contributor.departmentInstitute of Physicsen_US
dc.date.accessioned2014-12-08T15:45:05Z
dc.date.available2014-12-08T15:45:05Z
dc.date.issued2000-07-01en_US
dc.description.abstractWe have successfully made a series of thick CuxGe100-x films spanning the weakly and strongly localized regimes. With decreasing mole concentration of Cu relative to Ge, the resistivity of film becomes bigger at a given temperature and demonstrates a stronger temperature dependence at low temperatures. When x is big, 46 less than or equal to x less than or equal to 56, resistivity increases with the square root of the decreasing temperature, implying a weak-disorder behavior. For x small, 14 less than or equal to x less than or equal to 2.0, resistivity increases exponentially with decreasing temperature, implying a strongly localized behavior. The results show that the low-temperature transport in these films is dominated by the disorder enhanced electron-electron interaction effects. (C) 2000 Elsevier Science B.V. All rights reserved.en_US
dc.identifier.doi10.1016/S0921-4526(99)02606-Xen_US
dc.identifier.issn0921-4526en_US
dc.identifier.journalPHYSICA Ben_US
dc.identifier.urihttp://dx.doi.org/10.1016/S0921-4526(99)02606-Xen_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/30413
dc.identifier.wosnumberWOS:000087423100030
dc.language.isoen_USen_US
dc.subjectdisordered metalsen_US
dc.subjectelectron-electron interactionen_US
dc.subjecthoppingen_US
dc.subjectquantum transporten_US
dc.titleElectron-electron interaction dominated quantum transport in thick CuGe filmsen_US
dc.typeArticle; Proceedings Paperen_US

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