平面及鰭狀場效電晶體高階奈米缺陷統計物理模式：隨機電報雜訊和偏壓溫度不穩度

dc.contributor.author	陳明哲	zh_TW
dc.contributor.author	CHEN MING-JER	en_US
dc.contributor.department	國立交通大學電子工程學系及電子研究所	zh_TW
dc.date.accessioned	2016-03-29T00:01:12Z
dc.date.available	2016-03-29T00:01:12Z
dc.date.issued	2016	en_US
dc.description.sponsorship	科技部	zh_TW
dc.identifier.govdoc	MOST104-2221-E009-058-MY3	zh_TW
dc.identifier.uri	https://www.grb.gov.tw/search/planDetail?id=11715770&docId=478043	en_US
dc.identifier.uri	https://ir.lib.nycu.edu.tw/handle/11536/130900
dc.language.iso	zh_TW	en_US
dc.title	平面及鰭狀場效電晶體高階奈米缺陷統計物理模式：隨機電報雜訊和偏壓溫度不穩度	zh_TW
dc.title	Advanced Nanoscale Defect Statistical Model for Random Telegraph Signals and Bias and Temperature Instabilities in Planar Mosfets and FinFETs	en_US
dc.type	Plan	en_US

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