複合修飾電極試片
| dc.citation.patentcountry | TWN | zh_TW |
| dc.citation.patentnumber | I336782 | zh_TW |
| dc.contributor.author | 陳思豪 | en_US |
| dc.contributor.author | 林志生 | en_US |
| dc.contributor.author | 陳冠廷 | en_US |
| dc.contributor.author | 林岳暉 | en_US |
| dc.contributor.author | 沈燕士 | en_US |
| dc.date.accessioned | 2014-12-16T06:16:48Z | |
| dc.date.available | 2014-12-16T06:16:48Z | |
| dc.date.issued | 2011-02-01 | en_US |
| dc.description.abstract | 本發明係關於一種用於測量電化學訊號之具表面修飾之電極試片，其經由奈米尺寸金粒子層與脂溶性電子媒介物層，協同放大電子訊號。本發明另關於含有該電極試片之生物感測器。 | zh_TW |
| dc.identifier.govdoc | G01N033/53 | zh_TW |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/106104 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | 複合修飾電極試片 | zh_TW |
| dc.type | Patents | en_US |