Characteristics of MIS Solar Cells Using Sputtering SiO2 Insulating Layers
| dc.citation.epage | 1321 | en_US |
| dc.citation.spage | 1318 | en_US |
| dc.citation.woscount | 0 | en_US |
| dc.contributor.author | Chang, Tzu-Yueh | en_US |
| dc.contributor.author | Chang, Chun-Lung | en_US |
| dc.contributor.author | Lee, Hsin-Yu | en_US |
| dc.contributor.author | Lee, Po-Tsung | en_US |
| dc.contributor.department | 光電工程學系 | zh_TW |
| dc.contributor.department | Department of Photonics | en_US |
| dc.date.accessioned | 2019-04-02T06:04:28Z | |
| dc.date.available | 2019-04-02T06:04:28Z | |
| dc.date.issued | 2010-01-01 | en_US |
| dc.description.abstract | In this study, the characteristics of both p-type and n-ype Metal-Insulator-Semiconductor (MIS) solar cells with sputtering SiO2 insulating layers fabricated by radio-frequency (RF) magnetron sputtering are investigated. The characteristics of MIS solar cells are considerably affected by the thickness of the SiO2 insulating layer and a hydrogen (H-2) annealing process. Moreover, the performance of MIS solar cells with sputtering SiO2 insulating layer can be greatly enhanced by depositing a SiNx passivation layer on top. It suggests that a sputtering SiO2 insulating layer is a good alternative insulating layer for MIS solar cells. | en_US |
| dc.identifier.issn | 0160-8371 | en_US |
| dc.identifier.journal | 35TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/150520 | |
| dc.identifier.wosnumber | WOS:000287579501113 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Characteristics of MIS Solar Cells Using Sputtering SiO2 Insulating Layers | en_US |
| dc.type | Proceedings Paper | en_US |
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