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Chemical vapour deposition growth of graphene layers on metal substrates

dc.citation.volume558en_US
dc.citation.woscount0en_US
dc.contributor.authorLai, Y-Cen_US
dc.contributor.authorYu, S-Cen_US
dc.contributor.authorRafailov, P. M.en_US
dc.contributor.authorVlaikova, E.en_US
dc.contributor.authorValkov, S.en_US
dc.contributor.authorPetrov, S.en_US
dc.contributor.authorKoprinarova, J.en_US
dc.contributor.authorTerziyska, P.en_US
dc.contributor.authorMarinova, V.en_US
dc.contributor.authorLin, S. H.en_US
dc.contributor.authorYu, P.en_US
dc.contributor.authorChi, G. C.en_US
dc.contributor.authorDimitrov, D.en_US
dc.contributor.authorGospodinov, M. M.en_US
dc.contributor.department光電工程學系zh_TW
dc.contributor.departmentDepartment of Photonicsen_US
dc.date.accessioned2015-07-21T11:21:56Z
dc.date.available2015-07-21T11:21:56Z
dc.date.issued2014-01-01en_US
dc.description.abstractGraphene layers were grown by chemical vapour deposition (CVD) on Si wafers covered by a SiO2 substrate layer and a Ni interlayer, and on copper and nickel foil. The obtained graphene layers were characterized by Raman spectroscopy. The films grown on SiO2/Ni substrate and Ni foil comprise mainly multilayer defect-rich graphene, while those on Cu foil exhibit the spectroscopic fingerprint of relatively defect-free single-layer graphene due to the low carbon solubility in copper and the suitably chosen substrate position in a quasi-closed volume. Optimal growth conditions and the nature of defects in the layers are discussed.en_US
dc.identifier.doi10.1088/1742-6596/558/1/012059en_US
dc.identifier.issn1742-6588en_US
dc.identifier.journal18TH INTERNATIONAL SCHOOL ON CONDENSED MATTER PHYSICS: CHALLENGES OF NANOSCALE SCIENCE: THEORY, MATERIALS, APPLICATIONSen_US
dc.identifier.urihttp://dx.doi.org/10.1088/1742-6596/558/1/012059en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/124890
dc.identifier.wosnumberWOS:000346637900059en_US
dc.language.isoen_USen_US
dc.titleChemical vapour deposition growth of graphene layers on metal substratesen_US
dc.typeProceedings Paperen_US

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