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DEA Malmquist productivity measure: Taiwanese semiconductor companies

dc.citation.epage379en_US
dc.citation.issue1en_US
dc.citation.spage367en_US
dc.citation.volume112en_US
dc.contributor.authorLiu, Fuh-Hwa Franklinen_US
dc.contributor.authorWang, Peng-hsiangen_US
dc.contributor.department工業工程與管理學系zh_TW
dc.contributor.departmentDepartment of Industrial Engineering and Managementen_US
dc.date.accessioned2014-12-08T15:44:35Z
dc.date.available2014-12-08T15:44:35Z
dc.date.issued2008-03-01en_US
dc.description.abstractIn this research we employ data envelopment analysis (DEA) to measure the Malmquist productivity of semiconductor packaging and testing firms in Taiwan from 2000 to 2003. Malmquist productivity has three components: the measurement of technical change, the measurement of the frontier forward shift, and the measurement of the frontier backward shift of a company over two consecutive periods. This approach not only reveals patterns of productivity change and presents a new interpretation along with the managerial implication of each Malmquist component, but also identifies the strategy shifts of individual companies based upon isoquant changes. Therefore, one can judge with greater accuracy whether or not such strategy shifts are favorable and promising. We use slacks-based measurement (SBM) and Super-SBM models to obtain more accurate measurements. Comparison is made between the results from SBM/Super-SBM and CCR models. (C) 2007 Elsevier B.V. All rights reserved.en_US
dc.identifier.doi10.1016/j.ijpe.2007.03.015en_US
dc.identifier.issn0925-5273en_US
dc.identifier.journalINTERNATIONAL JOURNAL OF PRODUCTION ECONOMICSen_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.ijpe.2007.03.015en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/30098
dc.identifier.wosnumberWOS:000253605200031
dc.language.isoen_USen_US
dc.subjectdata envelopment analysisen_US
dc.subjectMalmquist productivityen_US
dc.subjectSuper-SBMen_US
dc.titleDEA Malmquist productivity measure: Taiwanese semiconductor companiesen_US
dc.typeArticle; Proceedings Paperen_US

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