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雙瞳孔量測方法以及雙瞳孔量測裝置

dc.citation.patentcountryTWNzh_TW
dc.citation.patentnumber201622635zh_TW
dc.contributor.author歐陽盟en_US
dc.contributor.author黃庭緯en_US
dc.contributor.author邱俊誠en_US
dc.contributor.author柯美蘭en_US
dc.contributor.author葉伯壽en_US
dc.contributor.author吳志成en_US
dc.contributor.author鄭偉德en_US
dc.contributor.author陳胤源en_US
dc.contributor.author寸碧秀en_US
dc.date.accessioned2016-12-20T05:04:22Z
dc.date.available2016-12-20T05:04:22Z
dc.date.issued2016-07-01en_US
dc.description.abstract一種雙瞳孔量測方法,包含下列步驟。發射第一可 見光束以及第一不可見光束至右眼。發射第二可見光束以及第二不可見光束至左眼。以光學單元接收來自右眼以及左眼反射之光束,並導引第一不可見光束以及第二不可見光束至成像單元。透過來自光學單元的第一不可見光束以及第二不可見光束,分別記錄右眼以及左眼之影像。zh_TW
dc.identifier.govdocA61B003/10zh_TW
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/132284
dc.language.isozh_TWen_US
dc.title雙瞳孔量測方法以及雙瞳孔量測裝置zh_TW
dc.typePatentsen_US

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