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Fault dictionary size reduction for million-gate large circuits

dc.citation.epage834en_US
dc.citation.spage829en_US
dc.contributor.authorHong, Yu-Ruen_US
dc.contributor.authorHuang, Juinn-Daren_US
dc.contributor.department電子工程學系及電子研究所zh_TW
dc.contributor.departmentDepartment of Electronics Engineering and Institute of Electronicsen_US
dc.date.accessioned2014-12-08T15:08:24Z
dc.date.available2014-12-08T15:08:24Z
dc.date.issued2007en_US
dc.description.abstractIn general, fault dictionary is prevented from practical applications for its extremely large size. Several previous works are proposed for the fault dictionary size reduction. However, they might not be able to handle today's million-gate circuits due to the high time and space complexity. In this paper, we propose an algorithm to significantly reduce the size of fault dictionary while still preserving high diagnostic resolution. The proposed algorithm possesses extremely low time and space complexity by avoiding constructing the huge distinguishability table, which inevitably boosts up the required computation complexity. Experimental results demonstrate that the proposed algorithm is fully capable of handling industrial million-gate large circuits in a reasonable amount of runtime and memory.en_US
dc.identifier.isbn978-1-4244-0629-6en_US
dc.identifier.journalPROCEEDINGS OF THE ASP-DAC 2007en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/6501
dc.identifier.wosnumberWOS:000246176800152
dc.language.isoen_USen_US
dc.titleFault dictionary size reduction for million-gate large circuitsen_US
dc.typeArticleen_US

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