超大型積體電路之測試與可測試設計
| dc.contributor.author | 李崇仁 | en_US |
| dc.contributor.department | 交通大學電子工程系 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:36:52Z | |
| dc.date.available | 2014-12-13T10:36:52Z | |
| dc.date.issued | 1999 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC88-2215-E009-062 | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=418219&docId=74193 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/94228 | |
| dc.language.iso | zh_TW | en_US |
| dc.subject | 超大型積體電路 | zh_TW |
| dc.subject | 可測試性設計 | zh_TW |
| dc.subject | 靜態電流測試 | zh_TW |
| dc.subject | 振盪環測試 | zh_TW |
| dc.subject | 錯誤診斷 | zh_TW |
| dc.subject | VLSI | en_US |
| dc.subject | IDDQ testing | en_US |
| dc.subject | Burn-in testing | en_US |
| dc.subject | Oscillation ring testing | en_US |
| dc.subject | Fault diagnosis | en_US |
| dc.title | 超大型積體電路之測試與可測試設計 | zh_TW |
| dc.title | VLSI Testing and Design for Testability | en_US |
| dc.type | Plan | en_US |