Hotspot Detection in Integrated Circuits by Two-photon-fluorescence-based Thermal Microscope
| dc.citation.epage | 0 | en_US |
| dc.citation.spage | 0 | en_US |
| dc.citation.woscount | 0 | en_US |
| dc.contributor.author | Zhuo, Guan-Yu | en_US |
| dc.contributor.author | Yang, Zu-Po | en_US |
| dc.contributor.author | Chan, Ming-Che | en_US |
| dc.contributor.department | 光電系統研究所 | zh_TW |
| dc.contributor.department | Institute of Photonic System | en_US |
| dc.date.accessioned | 2020-07-01T05:20:34Z | |
| dc.date.available | 2020-07-01T05:20:34Z | |
| dc.date.issued | 2018-01-01 | en_US |
| dc.description.abstract | For thermal images and related hotspot diagnosis on integrated circuits (ICs) during operation, we present a high temporal, spatial, and temperature resolution thermal microscope based on the thermal-optical properties of R6G thin film. | en_US |
| dc.identifier.isbn | 978-1-9435-8042-2 | en_US |
| dc.identifier.issn | 2160-9020 | en_US |
| dc.identifier.journal | 2018 CONFERENCE ON LASERS AND ELECTRO-OPTICS (CLEO) | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/154263 | |
| dc.identifier.wosnumber | WOS:000526031001479 | en_US |
| dc.language.iso | en_US | en_US |
| dc.title | Hotspot Detection in Integrated Circuits by Two-photon-fluorescence-based Thermal Microscope | en_US |
| dc.type | Proceedings Paper | en_US |
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