凸塊接點之電阻測量結構及包含其之封裝基板
| dc.citation.patentcountry | TWN | zh_TW |
| dc.citation.patentnumber | I439704 | zh_TW |
| dc.contributor.author | 陳智 | en_US |
| dc.contributor.author | 張元蔚 | en_US |
| dc.date.accessioned | 2014-12-16T06:12:17Z | |
| dc.date.available | 2014-12-16T06:12:17Z | |
| dc.date.issued | 2014-06-01 | en_US |
| dc.identifier.govdoc | G01R027/08 | zh_TW |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/103564 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | 凸塊接點之電阻測量結構及包含其之封裝基板 | zh_TW |
| dc.type | Patents | en_US |