以電子背散射繞射儀(EBSD)來研究錫膜的電遷移行為
| dc.contributor.author | 陳智 | en_US |
| dc.contributor.author | Chen Chih | en_US |
| dc.contributor.department | 交通大學材料科學與工程系 | zh_TW |
| dc.date.accessioned | 2014-12-13T10:31:38Z | |
| dc.date.available | 2014-12-13T10:31:38Z | |
| dc.date.issued | 2004 | en_US |
| dc.description.sponsorship | 行政院國家科學委員會 | zh_TW |
| dc.identifier.govdoc | NSC93-2216-E009-018-Y | zh_TW |
| dc.identifier.uri | https://www.grb.gov.tw/search/planDetail?id=913158&docId=172684 | en_US |
| dc.identifier.uri | https://ir.lib.nycu.edu.tw/handle/11536/91087 | |
| dc.language.iso | zh_TW | en_US |
| dc.title | 以電子背散射繞射儀(EBSD)來研究錫膜的電遷移行為 | zh_TW |
| dc.title | Study of Electromigration Behavior in Sn Films Using EBSD | en_US |
| dc.type | Plan | en_US |