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以UHV/CVD低溫成長複晶薄膜及其金屬矽化物於次微米元件之應用

dc.contributor.author雷添福en_US
dc.contributor.authorLEI TAN-FUen_US
dc.contributor.department國立交通大學電子工程研究所zh_TW
dc.date.accessioned2014-12-13T10:39:03Z
dc.date.available2014-12-13T10:39:03Z
dc.date.issued1996en_US
dc.description.sponsorship行政院國家科學委員會zh_TW
dc.identifier.govdocNSC85-2215-E009-051zh_TW
dc.identifier.urihttps://www.grb.gov.tw/search/planDetail?id=218531&docId=38691en_US
dc.identifier.urihttps://ir.lib.nycu.edu.tw/handle/11536/96018
dc.language.isozh_TWen_US
dc.title以UHV/CVD低溫成長複晶薄膜及其金屬矽化物於次微米元件之應用zh_TW
dc.titleLow Temperature Growth of Polycrystalline Silicon by UHV/CVD and Its Metal Silicide for the Application of Submicron Devicesen_US
dc.typePlanen_US

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